參數(shù)資料
型號(hào): HYB 514400BJ-60
廠商: SIEMENS AG
英文描述: 4M × 1-Bit Dynamic RAM(4M × 1位動(dòng)態(tài)RAM)
中文描述: 4米× 1位動(dòng)態(tài)隨機(jī)存儲(chǔ)器(4米× 1位動(dòng)態(tài)內(nèi)存)
文件頁(yè)數(shù): 23/24頁(yè)
文件大小: 124K
代理商: HYB 514400BJ-60
HYB 514400BJ-50/-60
1M
×
4 DRAM
Semiconductor Group
23
1998-10-01
Test Mode
As the HYB 514400BJ is organized internally as 512k
×
8-bits, a test mode cycle using 8:1
compression can be used to improve test time. Note that in the 1M
×
4 version the test time is
reduced by 1/2 for a linear test pattern.
In a test mode “write” the data from each I/O1 pin is written into eight bits simultaneously (all “1” or
all “0”).The I/O2 - I/O4 inputs are not used for writing in test mode. In test mode “read” each I/O
output is used for indicating the test mode result. If the internal eight bits are equal, the I/O would
indicate a “1”. If they were not equal, the I/O would indicate a “0”. Note that in test mode read“
I/O1-I/O3 are always driven to “ones”, i.e. all outputs will be “1” for a test mode “pass”. The WCBR
cycle (WE, CAS-before-RAS) puts the device into test mode. To exit from test mode, a
“CAS-before-RAS refresh”, “RAS-only refresh” or “Hidden refresh” can be used.
Addresses A10R, A10C and A0C are don‘t care during test mode.
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
HYB514400BJ-60 制造商:Siemens 功能描述:Dynamic RAM, Fast Page, 1M x 4, 26 Pin, Plastic, SOJ
HYB514400BJ-70 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:1M x 4-BIT DYNAMIC RAM LOW POWER 1M x 4-BIT DYNAMIC RAM
HYB514400BJ-80 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:1M x 4-Bit Dynamic RAM Low Power 1M x 4-Bit Dynamic RAM
HYB514400BJ-BT60 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:1M x 4-Bit Dynamic RAM Low Power 1M x 4-Bit Dynamic RAM
HYB514400BJL-50 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:1M x 4-BIT DYNAMIC RAM LOW POWER 1M x 4-BIT DYNAMIC RAM