參數(shù)資料
型號： HY5DU28822BT-X
廠商： Hynix Semiconductor Inc.
英文描述： 128M-S DDR SDRAM
中文描述： 128M的，擰DDR SDRAM內(nèi)存
文件頁數(shù)： 24/33頁
文件大?。?/td> 343K
代理商： HY5DU28822BT-X
HY5DU28422B(L)T
HY5DU28822B(L)T
Rev. 0.3/May. 02
24
DETAILED TEST CONDITIONS FOR DDR SDRAM IDD1 & IDD7
IDD1 : Operating current: One bank operation
1. Only one bank is accessed with tRC(min), Burst Mode, Address and Control inputs on NOP edge are
changing once per clock cycle. lout = 0mA
2. Timing patterns
- DDR200(100Mhz, CL=2) : tCK = 10ns, CL2, BL=2, tRCD = 2*tCK, tRAS = 5*tCK
Read : A0 N R0 N N P0 N A0 N - repeat the same timing with random address changing
- DDR266B(133Mhz, CL=2.5) : tCK = 7.5ns, CL=2.5, BL=2, tRCD = 3*tCK, tRC = 9*tCK, tRAS = 6*tCK
Read : A0 N N R0 N P0 N N N A0 N - repeat the same timing with random address changing
50% of data changing at every burst
- DDR266A (133Mhz, CL=2) : tCK = 7.5ns, CL=2, BL=2, tRCD = 3*tCK, tRC = 9*tCK, tRAS = 6*tCK
Read : A0 N N R0 N P0 N N N A0 N - repeat the same timing with random address changing
50% of data changing at every burst
- DDR266(133Mhz, CL=2) : tCK = 7.5ns, CL=2, BL=2, tRCD = 2*tCK, tRC = 8*tCK, tRAS = 6*tCK
Read : A0 N R0 N N N P0 N A0 N - repeat the same timing with random address changing
50% of data changing at every burst
- DDR333(166Mhz, CL=2.5) : tCK = 6ns, CL=2, BL=2, tRCD = 3*tCK, tRC = 10*tCK, tRAS = 7*tCK
Read : A0 N N R0 N N N P0 N N A0 N - repeat the same timing with random address changing
50% of data changing at every burst
Legend : A=Activate, R=Read, W=Write, P=Precharge, N=NOP
IDD7 : Operating current: Four bank operation
1. Four banks are being interleaved with tRC(min), Burst Mode, Address and Control inputs on NOP edge are not
changing. lout = 0mA
2. Timing patterns
- DDR200(100Mhz, CL=2) : tCK = 10ns, CL2, BL=4, tRRD = 2*tCK, tRCD= 3*tCK, Read with autoprecharge
Read : A0 N A1 R0 A2 R1 A3 R2 A0 R3 A1 R0 - repeat the same timing with random address changing
50% of data changing at every burst
- DDR266B(133Mhz, CL=2.5) : tCK = 7.5ns, CL=2.5, BL=4, tRRD = 2*tCK, tRCD = 3*tCK Read with autoprecharge
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing
50% of data changing at every burst
- DDR266A (133Mhz, CL=2) : tCK = 7.5ns, CL2=2, BL=4, tRRD = 2*tCK, tRCD = 3*tCK
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing
50% of data changing at every burst
- DDR333(166Mhz, CL=2.5) : tCK = 6ns, CL=2.5, BL=4, tRRD = 2*tCK, tRCD = 3*tCK, Read with autoprecharge
Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing
50% of data changing at every burst
Legend : A=Activate, R=Read, W=Write, P=Precharge, N=NOP
相關(guān)PDF資料
PDF描述
HY5DU561622DLTP 256M DDR SDRAM (268,435,456-bit CMOS Double Data Rate(DDR) Synchronous DRAM)
HY5DU561622DLTP-H 256M DDR SDRAM (268,435,456-bit CMOS Double Data Rate(DDR) Synchronous DRAM)
HY5DU561622DLTP-J 256M DDR SDRAM (268,435,456-bit CMOS Double Data Rate(DDR) Synchronous DRAM)
HY5DU561622DLTP-K 256M DDR SDRAM (268,435,456-bit CMOS Double Data Rate(DDR) Synchronous DRAM)
HY5DU561622DLTP-L 256M DDR SDRAM (268,435,456-bit CMOS Double Data Rate(DDR) Synchronous DRAM)
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
HY5DU28822DLT 制造商:HYNIX 制造商全稱:Hynix Semiconductor 功能描述:128Mb-S DDR SDRAM
HY5DU28822DLT-X 制造商:HYNIX 制造商全稱:Hynix Semiconductor 功能描述:128Mb-S DDR SDRAM
HY5DU28822DT 制造商:HYNIX 制造商全稱:Hynix Semiconductor 功能描述:128Mb-S DDR SDRAM
HY5DU28822DT-X 制造商:HYNIX 制造商全稱:Hynix Semiconductor 功能描述:128Mb-S DDR SDRAM
HY5DU28822ETP 制造商:HYNIX 制造商全稱:Hynix Semiconductor 功能描述:128Mb DDR SDRAM
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