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參數(shù)資料
| 型號(hào)： | HLX6228KEN |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | 128K x 8 STATIC RAM?Low Power SOI |
| 中文描述： | 128K的× 8靜態(tài)RAM？低功耗絕緣硅 |
| 文件頁(yè)數(shù)： | 9/12頁(yè) |
| 文件大小： | 156K |
| 代理商： | HLX6228KEN |
9
HLX6228
TESTER AC TIMING CHARACTERISTICS
RELIABILITY
Honeywell understands the stringent reliability requirements
for space and defense systems and has extensive experi-
ence in reliability testing on programs of this nature. This
experience is derived from comprehensive testing of VLSI
processes. Reliability attributes of the RICMOS
TM
process
were characterized by testing specially designed irradiated
and non-irradiated test structures from which specific failure
mechanisms were evaluated. These specific mechanisms
included, but were not limited to, hot carriers, electromigra-
tion and time dependent dielectric breakdown. This data
was then used to make changes to the design models and
process to ensure more reliable products.
In addition, the reliability of the RICMOS
TM
process and
product in a military environment was monitored by testing
irradiated and non-irradiated circuits in accelerated dy-
namic life test conditions. Packages are qualified for prod-
uct use after undergoing Groups B & D testing as outlined
in MIL-STD-883, TM 5005, Class S. The product is quali-
fied by following a screening and testing flow to meet the
customer’s requirements. Quality conformance testing is
performed as an option on all production lots to ensure the
ongoing reliability of the product.
QUALITY AND RADIATION HARDNESS
ASSURANCE
Honeywell maintains a high level of product integrity through
process control, utilizing statistical process control, a com-
plete “Total Quality Assurance System,” a computer data
base process performance tracking system and a radia-
tion-hardness assurance strategy.
The radiation hardness assurance strategy starts with a
technology that is resistant to the effects of radiation.
Radiation hardness is assured on every wafer by irradiating
test structures as well as SRAM product, and then monitor-
ing key parameters which are sensitive to ionizing radia-
tion. Conventional MIL-STD-883 TM 5005 Group E testing,
which includes total dose exposure with Cobalt 60, may
also be performed as required. This Total Quality approach
ensures our customers of a reliable product by engineering
in reliability, starting with process development and con-
tinuing through product qualification and screening.
SCREENING LEVELS
Honeywell offers several levels of device screening to meet
your system needs. “Engineering Devices” are available
with limited performance and screening for breadboarding
and/or evaluation testing. Hi-Rel Level B and S devices
undergo additional screening per the requirements of MIL-
STD-883.
3 V
0 V
VDD/2
VDD/2
0.4 V
High Z
2.7 V
1.7 V
High Z
Input
Levels*
Output
Sense
Levels
High Z = 2.2V
* Input rise and fall times <1 ns/V
VDD-0.4V
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PDF描述 |
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| HLX6228KER | 128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSF | 128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSH | 128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSN | 128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSR | 128K x 8 STATIC RAM?Low Power SOI |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HLX6228KER | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSF | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSH | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSN | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:128K x 8 STATIC RAM?Low Power SOI |
| HLX6228KSR | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:128K x 8 STATIC RAM?Low Power SOI |
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