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參數(shù)資料
| 型號(hào)： | HI5741BIBZ |
| 廠商： | Intersil |
| 文件頁數(shù)： | 3/13頁 |
| 文件大?。?/td> | 0K |
| 描述： | DAC 14BIT 100MHZ 5.2V 28-SOIC |
| 標(biāo)準(zhǔn)包裝： | 26 |
| 設(shè)置時(shí)間： | 20ns |
| 位數(shù)： | 14 |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 電壓電源： | 模擬和數(shù)字，雙 ± |
| 功率耗散（最大）： | 650mW |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 28-SOIC（0.295"，7.50mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 28-SOIC W |
| 包裝： | 管件 |
| 輸出數(shù)目和類型： | 2 電流，單極；2 電流，雙極 |
| 采樣率（每秒）： | 100M |
11
FN4071.12
September 20, 2006
to change before another. In order to minimize this, the
Intersil HI5741 employs an internal register, just prior to the
current sources, which is updated on the clock edge. Lastly,
the worst case glitch on traditional D/A converters usually
occurs at the major transition (i.e., code 8191 to 8192).
However, due to the split architecture of the HI5741, the
glitch is moved to the 1023 to 1024 transition (and every
subsequent 1024 code transitions thereafter). This split
R/2R segmented current source architecture, which
decreases the amount of current switching at any one time,
makes the glitch practically constant over the entire output
range. By making the glitch a constant size over the entire
output range this effectively integrates this error out of the
end application.
In measuring the output glitch of the HI5741 the output is
terminated into a 64
load. The glitch is measured at any
one of the current cell carry (code 1023 to 1024 transition or
any multiple thereof) throughout the DACs output range.
The glitch energy is calculated by measuring the area under
the voltage-time curve. Figure 25 shows the area considered
as glitch when changing the DAC output. Units are typically
specified in picoVolt/seconds (pV/s).
Applications
Bipolar Applications
To convert the output of the HI5741 to a bipolar 4V swing,
the following applications circuit is recommended. The
reference can only provide 125
A of drive, so it must be
buffered to create the bipolar offset current needed to
generate the -2V output with all bits ‘off’. The output current
must be converted to a voltage and then gained up and
offset to produce the proper swing. Care must be taken to
compensate for the voltage swing and error.
Interfacing to the HSP45106 NCO-16
The HSP45106 is a 16-bit Numerically Controlled Oscillator
(NCO). The HSP45106 can be used to generate various
modulation schemes for Direct Digital Synthesis (DDS)
applications. Figure 27 shows how to interface an HI5741 to
the HSP45106.
Definition of Specifications
Integral Linearity Error (INL) is the measure of the worst
case point that deviates from a best fit straight line of data
values along the transfer curve.
Differential Linearity Error (DNL) is the measure of the error
in step size between adjacent codes along the converter’s
transfer curve. Ideally, the step size is 1 LSB from one code to
the next, and the deviation from 1 LSB is known as DNL. A
DNL specification of greater than -1 LSB guarantees
monotonicity.
Feedthru is the measure of the undesirable switching noise
coupled to the output.
Output Voltage Full Scale Settling Time is the time
required from the 50% point on the clock input for a full scale
step to settle within an
±1/2 LSB error band.
Output Voltage Small Scale Settling Time is the time
required from the 50% point on the clock input for a 100mV
step to settle within an 1/2 LSB error band. This is used by
applications reconstructing highly correlated signals such as
sine waves with more than 5 points per cycle.
Glitch Area (GE) is the switching transient appearing on the
output during a code transition. It is measured as the area
under the curve and expressed as a volt time specification
(typically pV-s).
Differential Gain (
AV) is the gain error from an ideal sine
wave with a normalized amplitude.
Differential Phase (
Φ) is the phase error from an ideal sine
wave.
(21) IOUT
100MHz
LOW PASS
FILTER
SCOPE
HI5741
64
50
FIGURE 24. GLITCH TEST CIRCUIT
FIGURE 25. MEASURING GLITCH ENERGY
a (mV)
t (ns)
GLITCH ENERGY = (
a x t)/2
HI5741
REF OUT
IOUT
1/2 CA2904
+
-
+
-
+
-
50
5k
1/2 CA2904
5k
60
240
240
HFA1100
VOUT
0.1
F
FIGURE 26. BIPOLAR OUTPUT CONFIGURATION
(21)
(26)
HI5741
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HI5741BIBZ-T | 功能描述:數(shù)模轉(zhuǎn)換器- DAC HI5741BIB IN TAPE RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換器數(shù)量:1 DAC 輸出端數(shù)量:1 轉(zhuǎn)換速率:2 MSPs 分辨率:16 bit 接口類型:QSPI, SPI, Serial (3-Wire, Microwire) 穩(wěn)定時(shí)間:1 us 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:SOIC-14 封裝:Tube |
| HI5741BIP | 制造商:Rochester Electronics LLC 功能描述:28 PDIP INDTEMP D/A 14 BIT 100 MHZ -5.2V - Bulk 制造商:Harris Corporation 功能描述: 制造商:Intersil Corporation 功能描述: |
| HI5741BIPS2503 | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| HI5741D DIE | 制造商:Harris Corporation 功能描述: |
| HI5741-EVS | 功能描述:數(shù)據(jù)轉(zhuǎn)換 IC 開發(fā)工具 HI5741 EVAL PL ATFORM RoHS:否 制造商:Texas Instruments 產(chǎn)品:Demonstration Kits 類型:ADC 工具用于評(píng)估:ADS130E08 接口類型:SPI 工作電源電壓:- 6 V to + 6 V |
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