參數(shù)資料
型號: HI5710AJCQ
廠商: INTERSIL CORP
元件分類: ADC
英文描述: Circular Connector; No. of Contacts:32; Series:MS27473; Body Material:Aluminum; Connecting Termination:Crimp; Connector Shell Size:18; Circular Contact Gender:Pin; Circular Shell Style:Straight Plug; Insert Arrangement:18-32 RoHS Compliant: No
中文描述: 1-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PQFP48
封裝: MQFP-48
文件頁數(shù): 12/20頁
文件大?。?/td> 154K
代理商: HI5710AJCQ
4-1542
Detailed Description
The HI5710A is a two step A/D converter featuring a 5-bit
upper comparator group and a 5-bit lower comparator group.
A user controllable internal calibration unit is used to improve
linearity.
The voltage references must be supplied externally, with V
RB
and V
RT
typically being set to 2.0V and 4.0V respectively.
Both chip enable and output enable pins are provided for
flexibility and to reduce power consumption. The digital
outputs can be inverted by control inputs LINV and MINV,
where LINV controls outputs D0 through D8 and MINV con-
trols output D9 (MSB). This allows for various digital output
data formats, such as straight binary, inverted binary, offset
two’s complement or inverted offset two’s complement.
Analog Input
The analog input typically requires a 2V
P-P
full scale input
signal. The full scale input can range from 1.8V
P-P
to
2.8V
P-P
dependent on the voltage references used.
The input capacitance is small when compared with other flash
type A/D converters. However, it is necessary to drive the input
with an amplifier with sufficient bandwidth and drive capability.
Op amps such as the HA5020 should make an excellent input
amplifier depending on the application requirements. In order to
prevent parasitic oscillation, it may be necessary to insert a
resistor between the output of the amplifier and the A/D input.
Be sure to consider the amplifiers settling time in CCD
applications or where step inputs are expected.
Reference Input
The analog input voltage range of the A/D is set by the voltage
difference between the V
RT
and V
RB
voltage references. The
HI5710A is designed for use with external voltage references
of 2.0V and 4.0V on V
RB
and V
RT
, respectively. The analog
input voltage range of the A/D will now be from 2.0V to 4.0V.
The V
RB
voltage reference range is 1.8V to 2.8V and the V
RT
voltage reference range is 3.6V to 4.6V. The voltage
difference between the V
RT
and V
RB
voltage references,
(V
RT
- V
RB
), can range from 1.8V to 2.8V.
The V
RT
and V
RB
voltage reference input pins must be
decoupled to analog ground to minimize noise on these
references. A 0.1
μ
F capacitor is usually adequate.
Clock Input
The HI5710A samples the input signal on the rising edge of the
clock with the digital data being latched at the digital outputs
(D0 - D9) after 3 clock cycles. The HI5710A is designed for use
with a 50% duty cycle square wave, but a 10% variation should
not affect performance.
The clock input can be driven from +3.3V CMOS or +5V
TTL/CMOS logic. When using a +3.3V digital supply, HC or
AC CMOS logic will work well.
Digital Inputs
The digital inputs can be driven from +3.3V CMOS or +5V
TTL/CMOS logic. When using a +3.3V digital supply, HC or
AC CMOS logic will work well.
Digital Outputs
The digital outputs are CMOS outputs. The LINV control
input will invert outputs D0 through D8 and MINV control
input will invert output D9 (MSB). This allows the user to set
the digital output data for a number of different digital for-
mats. The outputs can also be three-stated by pulling the OE
control input high.
The digital output supply can run from +3.3V or +5V. The
digital outputs will generate less radiated noise using +3.3V,
but the outputs will have less drive capability. The digital
outputs will only swing to DV
DD
, therefore exercise care if
interfacing to +5V logic when using a +3.3V supply.
The digital output data can also be set to a fixed,
predetermined state, through the use of the TESTMODE,
LINV and MINV control input signals, see the Digital Output
Data Format table. By setting the TESTMODE pin low, the
outputs go to a defined digital pattern. This pattern is varied
by the MINV and LINV control inputs. This feature can be
used for in-circuit testing of the digital output data bus.
Calibration Function
The HI5710A has a built-in calibration unit which is designed
to provide superior linearity by correcting the gain error of
the subrange amplification circuitry. In addition to the
calibration unit, the HI5710A provides a built-in auto
calibration pulse generation function. Figure 20 shows a
functional block diagram of the auto calibration pulse
generator circuit.
The calibration pulse generation functions provided can be
subdivided into four operational areas. The first function is
the generation of the calibration pulses required to complete
the initial (power-up) calibration process when power is first
supplied to the converter. The next two functions accommo-
dated are the generation of periodic calibration pulses, either
internally or externally, to maintain calibration. The last
function is the provision for externally initiating or re-initiating
the power-up calibration process.
Power-up Calibration Function
The initial power-up calibration requires over 600 calibration
pulses in order to complete the calibration process when
power is first applied to the converter. The power-up calibra-
tion function provided by the auto calibration pulse generator
automatically generates these pulses internally and
completes the initial calibration process. The following five
conditions must be satisfied in order for the auto calibration
pulse generator power-up calibration process to be initiated :
a) The voltage between AV
DD
and AV
SS
is approximately
2.5V or more.
b) The voltage between V
RT
and V
RB
is approximately 1.0V
or more.
c) The RESET control input pin (Pin 15) must be high
(logic 1).
d) The CE control input pin (Pin 24) must be low (logic 0).
e) Condition b must be met after condition a.
Once all five of these conditions is satisfied the power-up
calibration pulses are generated. These power-up calibration
pulses are derived from a divided-by sixteen sample clock
HI5710A
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