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參數(shù)資料
| 型號： | HFX4MAA-30.0000 |
| 廠商： | PERICOM SEMICONDUCTOR CORP |
| 元件分類： | 晶體 |
| 英文描述： | QUARTZ CRYSTAL RESONATOR, 30 MHz |
| 封裝： | MINIATURE PACKAGE-2 |
| 文件頁數(shù)： | 1/2頁 |
| 文件大小： | 23K |
| 代理商： | HFX4MAA-30.0000 |
SaRonix
Quartz Crystal
Technical Data
HFX4 Series
SaRonix
DS-128
REV D
141 Jefferson Drive Menlo Park, CA 94025 USA 650-470-7700 800-227-8974 Fax 650-462-9894
High Frequency Fundamental AT Cut
Frequency Range:
Frequency Calibration
Tolerance @ 25°C:
Load Capacitance:
±25, ±50, ±100 ppm. Others available, contact SaRonix
4 pF to Series
30 to 250 MHz Fundamental
Description
Crystals in the HFX4 Series are rugged,
very high frequency miniature AT-cut
resonators housed in cold-welded tubu-
lar packages. Patented Tab-Mesa Tech-
nology (TmT), proprietary to SaRonix,
is used to achieve fundamental resona-
tors to 250 MHz.
ACTUAL SIZE
Storage Temperature:
Mechanical:
+85°C max
Applications & Features
Telecommunications
Wireless RF Applications
Video, graphics
VCXO's
Low jitter, high frequency oscillators
Ultra low power oscillators and
transmitters
Micro-miniature modules
Small package, cold weld seal
AT cut
Temperature Stability:
±10, ±25, ±50, ±100 ppm over -20°C to +70°C typical.
Others available, contact SaRonix
Drive Level:
25W correlation, 500W maximum
Quality Factor (Q):
see Typical Crystal Parameters, Chart 1
Motional Capacitance (C1):
see Typical Crystal Parameters, Chart 2
Shunt Capacitance (C0):
see Typical Crystal Parameters, Chart 3
see Typical Crystal Parameters,Chart 4
Effective Series Resistance:
Shock:
Solderability:
Terminal Strength:
Vibration:
Solvent Resistance:
Resistance to Soldering Heat:
MIL-STD-883, Method 2002, Condition B
MIL-STD-883, Method 2003
MIL-STD-202, Method 211, Conditions A and C
MIL-STD-883, Method 2007, Condition A
MIL-STD-202, Method 215
MIL-STD-202, Method 210, Condition B
Environmental:
Gross Leak Test:
Fine Leak Test:
Thermal Shock:
Moisture Resistance:
MIL-STD-883, Method 1014, Condition C
MIL-STD-883, Method 1014, Condition A2
<5 x 10-8 ATM cc/sec
MIL-STD-883, Method 1011, Condition A
MIL-STD-883, Method 1004
Part Numbering Guide
Type
HFX4 x x – 120.0000 – xx
Load Capacitance (pF)
(Blank = series resonant)
Frequency (MHz)
Frequency Calibration
Temperature Stability
AA = ±10 ppm -20°C to +70°C
A = ±25 ppm -20°C to +70°C
B = ±50 ppm -20°C to +70°C
C = ±100 ppm -20°C to +70°C
K =
L =
M =
±25 ppm
±50 ppm
±100 ppm
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HFX4LAA-FREQ | QUARTZ CRYSTAL RESONATOR, 30 MHz - 250 MHz |
| HFX4KAA-250.0000 | QUARTZ CRYSTAL RESONATOR, 250 MHz |
| HFX4KB-30.0000 | QUARTZ CRYSTAL RESONATOR, 30 MHz |
| HFX4KB-FREQ | QUARTZ CRYSTAL RESONATOR, 30 MHz - 250 MHz |
| HFX4KAA-120.0000 | QUARTZ CRYSTAL RESONATOR, 120 MHz |
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