參數(shù)資料
型號(hào)： HFA3860AIV96
廠商： INTERSIL CORP
元件分類(lèi)： 無(wú)繩電話/電話
英文描述： Circular Connector; No. of Contacts:5; Series:MS27473; Body Material:Aluminum; Connecting Termination:Crimp; Connector Shell Size:10; Circular Contact Gender:Pin; Circular Shell Style:Straight Plug; Insert Arrangement:10-5 RoHS Compliant: No
中文描述： TELECOM, CELLULAR, BASEBAND CIRCUIT, PQFP48
封裝： 7 X 7 X 1 MM, PLASTIC, TQFP-48
文件頁(yè)數(shù)： 32/39頁(yè)
文件大?。?/td> 251K
代理商： HFA3860AIV96
2-162
Bits 7:0
Test Bus Address = 07h
Freq Test Lo Rate
Test 7:0 = Freq Reg Lo Rate (18:11)
TEST_CLK = SUBSAMPLECLK (Symbol Clock)
Bits 7:0
Test Bus Address = 08h
Phase Test Lo Rate
Test 7:0 = Phase Reg Lo Rate (7:0)
TEST_CLK = SUBSAMPLECLK (Symbol Clock)
Bits 7:0
Test Bus Address = 09h
NCO Test Lo Rate
Test 7:0 = NCO Reg Lo Rate (15:8)
TEST_CLK = SUBSAMPLECLK (Symbol Clock)
Bits 7:0
Test Bus Address = 0Ah
Bit Sync Accum Lo Rate
Test 7:0 = Bit Sync Accumulator (7:3), exponent (2:0)
TEST_CLK = Last symbol indicator
Bits 7:0
Test Bus Address = 0Bh
Test PN Gen.,
Factory Test Only
Test 7:0 +TEST_CLK = Top 9 bits of PN generator used for fault tests.
Bits 7:0
Test Bus Address = 0Ch
A/D Cal Test Mode
Test 7 = A/D CAL (Full Scale)
Test 6 = ED, Energy Detect Comparator Output
Test 5 = A/D_CAL Disable
Test(4:0) = A/D_Cal(4:0)
TEST_CLK = A/D_Cal CLK
Bits 7:0
Test Bus Address = 0Dh
Correlator I High Rate,
tests the MBOK I correlator output.
Test 7:0 = Correlator I Hi Rate (8:1)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 0Eh
Correlator Q High Rate,
tests the MBOK Q correlator output.
Test 7:0 = Correlator Q Hi Rate (8:1)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 0Fh
Chip Error Accumulator,
Test 7:0 = Chip Error Accumulator (14:7)
TEST_CLK = 0
Bits 7:0
Test Bus Address = 10h
NCO Test Hi Rate,
tests the NCO in the high rate tracking section.
Test 7:0 = NCO Accum (19:12)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 11h
FREQ Test Hi Rate,
tests the NCO lag accumulator in the high rate tracking section.
Test 7:0 = Lag Accum (18:11)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 12h
Carrier Phase Error Hi Rate
Test 7:0 = Carrier Phase Error (6,6:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 13h
I_ROT Hi Rate,
tests the I Channel phase rotation error signal.
Test 7:0 = I_ROT (5,5,5:0)
TEST_CLK = Sample CLK
CONFIGURATION REGISTER 28 ADDRESS (70h) TEST BUS ADDRESS (Continued)
Supplies address for test pin outputs and Test Bus Monitor Register
HFA3860A
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
HFA3860B 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:nullDirect Sequence Spread Spectrum Baseband Processor
HFA3860BIV 制造商:Rochester Electronics LLC 功能描述:- Bulk
HFA3860BIV WAF 制造商:Harris Corporation 功能描述:
HFA3860BIV96 制造商:Rochester Electronics LLC 功能描述:- Bulk
HFA3860IV 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Harris Corporation 功能描述:
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