參數(shù)資料
型號: HD40C4084
廠商: Hitachi,Ltd.
英文描述: Low-Voltage AS Microcomputers with On-Chip A/D Converter(帶片上A/D轉(zhuǎn)換器的低壓微計(jì)算機(jī))
中文描述: 低電壓如同在微機(jī)芯片的A / D轉(zhuǎn)換器(帶片上的A / D轉(zhuǎn)換器的低壓微計(jì)算機(jī))
文件頁數(shù): 123/162頁
文件大小: 482K
代理商: HD40C4084
HD404374/HD404384/HD404389/HD404082/HD404084 Series
123
PROM Reliability after Programming:
In general, semiconductor devices retain their reliability,
provided that some initial defects can be excluded. These initial defects can be detected and rejected by
screening. Baking devices under high-temperature conditions is one method of screening that can rapidly
eliminate data-hold defects in memory cells. (Refer to the previous Principles of Programming/Erasure
section.)
ZTAT microcomputer devices are extremely reliable because they have been subjected to such a
screening method during the wafer fabrication process, but Hitachi recommends that each device be
exposed to 150
°
C at one atmosphere for at least 48 hours after it is programmed, to ensure its best
performance. The recommended screening procedure is shown in figure 74.
Note:
If programming errors occur continuously during PROM programming, suspend programming and
check for problems in the PROM programmer or socket adapter. If programming verification
indicates errors in programming or after high-temperature exposure, please inform Hitachi.
Note: Exposure time is measured from when the temperature in the heater reaches 150
°
C.
Programming, verification
Exposure to high temperature, without power
150
°
C
±
10
°
C, 48 h
+8 h
0 h
*
Program read check
V = 4.5 V or 5.5 V
Figure 74 Recommended Screening Procedure
Programming percentage:
Programming percentage is guarenteed to more than 95%.
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