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參數(shù)資料
| 型號： | HCS166HMSR |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened 8-Bit Parallel-Input/Serial Output Shift Register |
| 中文描述： | HC/UH SERIES, 8-BIT RIGHT PARALLEL IN SERIAL OUT SHIFT REGISTER, TRUE OUTPUT, UUC16 |
| 文件頁數(shù)： | 6/9頁 |
| 文件大?。?/td> | 227K |
| 代理商： | HCS166HMSR |
255
Specifications HCS166MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTES:
1. Alternate Group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
2. Table 5 parameters only.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC I BURN-IN (Note 1)
13
1 - 12, 14 - 15
-
16
-
-
STATIC II BURN-IN (Note 1)
13
8
-
1 - 7, 9 - 12, 14 - 16
-
-
DYNAMIC BURN-IN (Note 2)
-
2, 4, 6, 8, 10, 12
13
3, 5, 9, 11, 14 - 16
7
1
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1K
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
13
8
1 - 7, 9 - 12, 14 - 16
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518758
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| HCS166MS | Radiation Hardened 8-Bit Parallel-Input/Serial Output Shift Register(抗輻射8位并入串出移位寄存器) |
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