參數(shù)資料
型號: HAL710SF-E
廠商: Electronic Theatre Controls, Inc.
元件分類: 霍爾效應(yīng)傳感器
英文描述: Chip-on-Glass (COG) Technology, 16 Characters x 2 Lines
中文描述: 霍爾效應(yīng)的方向檢測傳感器
文件頁數(shù): 11/12頁
文件大?。?/td> 165K
代理商: HAL710SF-E
ADVANCE INFORMATION
HAL710
Micronas
11
4. Application Notes
4.1. Ambient Temperature
Due to the internal power dissipation, the temperature
on the silicon chip (junction temperature T
J
) is higher
than the temperature outside the package (ambient
temperature T
A
).
T
J
= T
A
+
T
At static conditions, the following equation is valid:
T = I
DD
* V
DD
* R
th
For typical values, use the typical parameters. For
worst case calculation, use the max. parameters for
I
DD
and R
th
, and the max. value for V
DD
from the appli-
cation.
For all sensors, the junction temperature range T
J
is
specified. The maximum ambient temperature T
Amax
can be calculated as:
T
Amax
= T
Jmax
T
4.2. Extended Operating Conditions
All sensors fulfil the electrical and magnetic character-
istics when operated within the Recommended Oper-
ating Conditions (see page 8)
Supply Voltage Below 3.8 V
Typically, the sensors operate with supply voltages
above 3 V, however, below 3.8 V some characteristics
may be outside the specification.
Note:
The functionality of the sensor below 3.8 V is not
tested. For special test conditions, please contact Mic-
ronas.
4.3. Signal Delay
The extra circuitry required for the direction detection
increases the latency of the
Count and Direction Sig-
nal
compared to a simple switch (e.g. HAL 525). This
extra delay corresponds to 0.5 and 1 clock period for
the
Direction Signal
and
Count Signal
respectively.
4.4. Test Mode Activation
In order to obtain the normal operation as described
above, two external pull-up resistors with appropriate
values are required to connect each output to an exter-
nal supply, such that the potential at the open-drain
output rises to at least 3 V in less than 10
μ
s after hav-
ing turned off the corresponding pull-down transistor or
after having applied V
DD
.
If the
Direction Output
is pulled low externally (the
potential does not rise after the internal pull-down tran-
sistor has been turned off), the device enters Manufac-
turer Test Mode.
Direction Detection is not functional in Manufacturer
Test Mode. The device returns to
Normal Operation
as soon as the
Count Output
goes high.
Please note, that the presence of a Manufacturer Test
Mode requires appropriate measures to prevent acci-
dental activation (e.g. in response to EMC events).
4.5. Start-up Behavior
Due to the active offset compensation, the sensors
have an initialization time (enable time t
en(O)
) after
applying the supply voltage. The parameter t
en(O)
is
specified in the Electrical Characteristics (see page 9)
During the initialization time, the output states are not
defined and the outputs can toggle. After t
en(O)
both
outputs will be either high or low for a stable magnetic
field (no toggling) and the
Count Output
will be low if
the applied magnetic field B exceeds B
ON
. The
Count
Output
will be high if B drops below B
OFF
. The
Direc-
tion Output
will have the correct state after the second
edge (rising or falling) in the same direction.
The device contains a Power-On Reset circuit (POR)
generating a reset when V
DD
rises. This signal is used
to initialize both outputs in the
Off-state
(i.e. Output
High) and to disable Test Mode. The generation of this
Reset Signal is guaranteed when V
DD
at the chip rises
to minimum 3.8 V in less than 4
μ
s monotonically. If
this condition is violated, the internal reset signal might
be missing. Under these circumstances the chip will
still operate according to the specification, but the risk
of toggling outputs during t
en(O)
increases and for mag-
netic fields between B
OFF
and B
ON
, the output states
of the Hall sensor after applying V
DD
will be either low
or high. In order to achieve a well defined output state,
the applied magnetic field then must exceed B
ONmax
,
respectively drop below B
OFFmin
.
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