參數(shù)資料
型號： HA4-5340883
廠商： Intersil Corporation
元件分類： 運動控制電子
英文描述： High Speed, Low Distortion, Precision Monolithic Sample and Hold Amplifier
中文描述： 高速，低失真，精密單片采樣和保持放大器
文件頁數(shù)： 4/12頁
文件大小： 347K
代理商： HA4-5340883
7-11
Specifications HA5340/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Hold Mode Feedthrough
V
HMF
V
IN
= 20V
P-P
, 200kHz
1
+25
o
C
-
-70
dB
Sample Mode Noise
Voltage
E
n(SAMPLE)
DC to 10MHz, V
S/H
= 0V,
R
LOAD
= 2K
1
+25
o
C
-
335
μ
V
RMS
Hold Mode Noise
Voltage
E
n(HOLD)
DC to 10MHz, V
S/H
= 5V,
R
LOAD
= 2K
1
+25
o
C
-
100
μ
V
RMS
Input Capacitance
C
IN
V
S/H
= 0V
1
+25
o
C
-
5
pF
Input Resistance
R
IN
V
S/H
= 0V, Delta V
IN
= 20V
1
+25
o
C
1
-
M
0.1% Acquisition Time
T
ACQ
0.1%
C
L
= 60pF, R
L
= 2K, V
OUT
= 0V
to 10V Step
1
+25
o
C
-
600
ns
Total Harmonic
Distortion Hold Mode
THD
200K(HOLD)
F
S
= 450kHz,
V
IN
= 20V
P-P
, 200kHz
1
+25
o
C
-
-50
dBc
THD
500K(HOLD)
F
S
= 450kHz,
V
IN
= 5V
P-P
, 500kHz
1
+25
o
C
-
-47
dBc
Total Harmonic
Distortion Sample Mode
THD
200K(SAMPLE)
V
IN
= 20V
P-P
, 200kHz
1
+25
o
C
-
-60
dBc
THD
500K(SAMPLE)
V
IN
= 5V
P-P
, 500kHz
1
+25
o
C
-
-49
dBc
NOTE:
1. The parameters listed in this table are controlled via design or process parameters and are not directly tested. These parameters are
characterized upon initial design release and upon design changes which would affect these characteristics.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In)
-
Final Electrical Test Parameters
1(Note 1), 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C and D Endpoints
1
NOTE:
1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.
CAUTION: These devices are sensitive to electronic discharge. Proper IC handling procedures should be followed.
Spec Number
511117-883
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