參數(shù)資料
型號: FBL22031
廠商: NXP Semiconductors N.V.
英文描述: 9-bit BTL 3.3V latched/registered/pass-thru Futurebus transceiver with 30W termination
中文描述: 9位橋接3.3鎖存/注冊/傳遞的功率30W直連Futurebus終端收發(fā)器
文件頁數(shù): 10/16頁
文件大?。?/td> 168K
代理商: FBL22031
Philips Semiconductors
Product specification
FBL22031
9-bit BTL 3.3V latched/registered/pass-thru
Futurebus+ transceiver with 30
termination
2000 Apr 18
10
AC ELECTRICAL CHARACTERISTICS
A TO B 9
LOAD SPECIFICATIONS
T
amb
= +25
°
C,
V
CC
= 3.3V,
MIN
TYP
MAX
SYMBOL
PARAMETER
TEST
CONDITION
T
amb
= –40 to +85
°
C,
V
CC
= 3.3V
±
10%,
MIN
UNIT
MAX
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
Propagation delay (thru latch)
An to Bn
Propagation delay (transparent latch)
An to Bn
Propagation delay
LCAB to Bn (latch)
Propagation delay
LCAB to Bn (register)
Propagation delay
SEL0 or SEL1 to Bn (inverting)
Propagation delay
SEL0 or SEL1 to Bn (non-inverting)
Waveform 1, 2
1.2
1.2
1.2
1.3
7.2
7.2
1.2
1.4
1.2
1.6
1.9
1.9
1.2
1.2
3.5
3.1
3.8
4.0
12.0
11.1
4.4
4.3
5.1
4.6
5.6
4.7
4.0
3.7
8.1
6.5
8.6
7.7
17.4
15.5
8.8
7.5
9.8
8.1
9.9
7.9
8.4
6.7
1.0
1.0
1.0
1.0
5.3
5.6
1.0
1.0
1.0
1.1
1.0
1.3
1.0
1.0
1.2
0.4
9.1
6.9
9.5
8.4
20.5
17.8
10.2
8.4
11.4
9.9
11.2
9.0
9.8
8.0
3.0
1.5
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
OEBn to Bn
Waveform 1, 2
ns
Output transition time, Bn Port
(1.3V to 1.8V)
Output to output skew for multiple
channels
1
Pulse skew
2
t
PHL
– t
PLH
MAX
Test Circuit and
Waveforms
ns
t
SK
(o)
Waveform 3
0.4
1.0
2.0
ns
t
SK
(p)
Waveform 2
0.3
1.0
1.5
ns
NOTES:
1.
t
PN
actual – t
PM
actual
for any data input to output path compared to any other data input to output path where N and M are either LH or
HL. Skew times are valid only under same test conditions (temperature, V
CC
, loading, etc.). t
SK
(0) compares t
PLH
on a given path to t
PLH
on any other path or compares t
PHL
on a given path to t
PHL
on any other path.
2. t
SK
(p) is used to quantify duty cycle characteristics. In essence it compares the input signal duty cycle to the corresponding output signal
duty cycle (50MHz input frequency and 50% duty cycle, tested on data paths only).
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