參數(shù)資料
型號: EVAL-AD7714-3EB
廠商: Analog Devices, Inc.
英文描述: 3 V/5 V, CMOS, 500 uA Signal Conditioning ADC
中文描述: 3 V / 5號第五的CMOS,500微安ADC的信號調(diào)理
文件頁數(shù): 7/40頁
文件大小: 306K
代理商: EVAL-AD7714-3EB
2
AD7714
REV. C
–7–
ORDERING GUIDE
AV
DD
Supply
Temperature
Range
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–40
°
C to +105
°
C
–40
°
C to +105
°
C
–40
°
C to +105
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
Evaluation Board
Evaluation Board
Package
Option*
Model
AD7714AN-5
AD7714AR-5
AD7714ARS-5
AD7714AN-3
AD7714AR-3
AD7714ARS-3
AD7714YN
AD7714YR
AD7714YRU
AD7714AChips-5
AD7714AChips-3
EVAL-AD7714-5EB 5 V
EVAL-AD7714-3EB 3 V
5 V
5 V
5 V
3 V
3 V
3 V
3 V/5 V
3 V/5 V
3 V/5 V
5 V
3 V
N-24
R-24
RS-28
N-24
R-24
RS-28
N-24
R-24
RU-24
Die
Die
*N = Plastic DIP; R = SOIC; RS = SSOP; RU = Thin Shrink Small Outline.
TIMING CHARACTERISTICS
1, 2
(AV
DD
= DV
DD
= +2.7 V to +5.25 V; AGND = DGND = 0 V; f
CLKIN
= 2.5MHz; Input Logic 0 = 0 V,
Limit at T
MIN
, T
MAX
Parameter
(A, Y Versions)
Units
f
CLKIN3, 4
400
kHz min
Logic 1 = DV
DD
unless otherwise noted.)
Conditions/Comments
Master Clock Frequency: Crystal/Resonator or Externally
Supplied
For Specified Performance
Master Clock Input Low Time. t
CLK IN
= 1/f
CLK IN
Master Clock Input High Time
DRDY
High Time
SYNC
Pulsewidth
RESET
Pulsewidth
2.5
0.4
×
t
CLK IN
0.4
×
t
CLK IN
500
×
t
CLK IN
100
100
MHz max
ns min
ns min
ns nom
ns min
ns min
t
CLK IN LO
t
CLK IN HI
t
DRDY
t
1
t
2
Read Operation
t
3
t
4
t
56
0
0
0
80
100
100
100
0
10
60
100
100
ns min
ns min
ns min
ns max
ns max
ns min
ns min
ns min
ns min
ns max
ns max
ns max
DRDY
to
CS
Setup Time
CS
Falling Edge to SCLK Active Edge Setup Time
5
SCLK Active Edge to Data Valid Delay
5
DV
DD
= +5V
DV
DD
= +3V
SCLK High Pulsewidth
SCLK Low Pulsewidth
CS
Rising Edge to SCLK Active Edge Hold Time
5
Bus Relinquish Time after SCLK Active Edge
5
DV
DD
= +5V
DV
DD
= +3V
SCLK Active Edge to
DRDY
High
5, 8
t
6
t
7
t
8
t
97
t
10
Write Operation
t
11
t
12
t
13
t
14
t
15
t
16
0
30
20
100
100
0
ns min
ns min
ns min
ns min
ns min
ns min
CS
Falling Edge to SCLK Active Edge Setup Time
5
Data Valid to SCLK Edge Setup Time
Data Valid to SCLK Edge Hold Time
SCLK High Pulsewidth
SCLK Low Pulsewidth
CS
Rising Edge to SCLK Edge Hold Time
NOTES
1
Sample tested at +25
°
C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of DV
DD
) and timed from a voltage level of 1.6 V.
2
See Figures 6 and 7. Timing applies for all grades.
3
CLKIN Duty Cycle range is 45% to 55%. CLKIN must be supplied whenever the AD7714 is not in standby mode. If no clock is present in this case, the device can
draw higher current than specified and possibly become uncalibrated.
4
The AD7714 is production tested with f
at 2.4576MHz (1MHz for some I
tests). It is guaranteed by characterization to operate at 400kHz.
5
SCLK active edge is falling edge of SCLK with POL = 1; SCLK active edge is rising edge of SCLK with POL = 0.
6
These numbers are measured with the load circuit of Figure 1 and defined as the time required for the output to cross the V
or V
limits.
7
These numbers are derived from the measured time taken by the data output to change 0.5V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove effects of charging or discharging the 100 pF capacitor. This means that the times quoted in the timing characteristics are the true bus
relinquish times of the part and as such are independent of external bus loading capacitances.
8
DRDY
returns high after the first read from the device after an output update. The same data can be read again, if required, while
DRDY
is high although care
should be taken that subsequent reads do not occur close to the next output update.
Specifications subject to change without notice.
Figure 1. Load Circuit for Access Time and Bus
Relinquish Time
TO OUTPUT
PIN
50pF
I
SINK
(800
m
A AT DV
DD
= +5V
100
m
A AT DV
DD
= +3.3V)
+1.6V
I
SOURCE
(200
m
A AT DV
DD
= +5V
100
m
A AT DV
DD
= +3.3V)
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