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參數(shù)資料
| 型號： | EVAL-AD5398EB |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | 120 mA, Current Sinking, 10-Bit, I2C DAC |
| 中文描述： | 120毫安，灌電流，10位和I2C數(shù)模轉(zhuǎn)換器 |
| 文件頁數(shù)： | 9/16頁 |
| 文件大?。?/td> | 223K |
| 代理商： | EVAL-AD5398EB |
AD5398
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSB, from a
straight line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot is shown in Figure 4.
Rev. A | Page 9 of 16
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot is shown in Figure 5.
(DNL)
Zero-Code Error
Zero-code error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally the
output is 0 mA. The zero-code error is always positive in the
AD5398 because the output of the DAC cannot go below 0 mA.
This is due to a combination of the offset errors in the DAC and
output amplifier. Zero-code error is expressed in mA.
Gain Error
This is a measurement of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percent of the full-scale range.
Gain Error Drift
This is a measurement of the change in gain error with changes
in temperature. It is expressed in LSB/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nA-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition.
Digital Feedthrough
Digital feedthrough is a measurement of the impulse injected
into the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nA-s and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Offset Error
Offset error is a measurement of the difference between I
SINK
(actual) and I
OUT
(ideal) in the linear region of the transfer
function, expressed in mA. Offset error is measured on the
AD5398 with Code 16 loaded into the DAC register.
Offset Error Drift
This is a measurement of the change in offset error with a
change in temperature. It is expressed in μV/°C.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| EVAL-AD5398EBZ | 制造商:Analog Devices 功能描述:EVALUATION BOARD I.C. - Bulk |
| EVAL-AD5405EB | 功能描述:BOARD EVAL FOR AD5405 RoHS:否 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5405EBZ | 功能描述:BOARD EVAL FOR AD5405 RoHS:是 類別:編程器，開發(fā)系統(tǒng) >> 評估板 - 數(shù)模轉(zhuǎn)換器 (DAC) 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1 系列:- DAC 的數(shù)量:4 位數(shù):12 采樣率（每秒）:- 數(shù)據(jù)接口:串行，SPI? 設(shè)置時間:3µs DAC 型:電流/電壓 工作溫度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5415EB | 制造商:Analog Devices 功能描述:EVALUATION BOARD I.C. - Bulk |
| EVAL-AD5415EBZ | 制造商:Analog Devices 功能描述:Evaluation Board For Dual 12-Bit, High Bandwidth, Multiplying DAC With 4-Quadrant Resistors And Serial Interface 制造商:Analog Devices 功能描述:DUAL 12-BIT, HIGH BANDWIDTH, MULTIPLYING DAC W/ 4-QUADRANT R - Bulk |
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