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參數(shù)資料
| 型號： | ES51C5F25N-14.400M |
| 廠商： | ECLIPTEK CORP |
| 元件分類： | TCXO, sine |
| 英文描述： | TCXO, CLIPPED SINE OUTPUT, 14.4 MHz |
| 封裝： | ROHS COMPLIANT, CERAMIC, SMD, 4 PIN |
| 文件頁數(shù)： | 2/2頁 |
| 文件大小： | 180K |
| 代理商： | ES51C5F25N-14.400M |
MANUFACTURER
CATEGORY
SERIES
PACKAGE
VOLTAGE
CLASS
REV
.DATE
ECLIPTEK CORP.
OSCILLATOR
ES51C5
CERAMIC
5.0V
OS1D
02/10
A
B
C
D
E
F
12.0±0.2
5.5±0.1
6.5±0.1
4.0±0.1
2.0±0.1
F
G
H
J
K
L
8.0±0.1
B0* 1.5 +0.1-0.0
A0*
0.30 ±0.05
K0*
TAPE
M
N
O
P
Q
1.5 MIN
50 MIN
20.2 MIN 13.0±0.2
40 MIN
R
S
T
U
V
QTY/REEL
2.5 MIN
10 MIN
18.4 MAX
180 MAX
12.4+2-0
1,000
REEL
*Compliant to EIA 481A
MECHANICAL DIMENSIONS
ALL DIMENSIONS IN MILLIMETERS
MARKING SPECIFICATIONS
ENVIRONMENTAL/MECHANICAL SPECIFICATIONS
SUGGESTED SOLDER PAD LAYOUT
ALL DIMENSIONS IN MILLIMETERS
TAPE AND REEL DIMENSIONS
ALL DIMENSIONS IN MILLIMETERS
Tolerances= +0.1
Line 1: E XX.XXX
Frequency in MHz (5 Digits Maximum + Decimal)
Line 2: XX Y ZZ
Week of Year
Last Digit of Year
Ecliptek Manufacturing Identifier
800-ECLIPTEK www.ecliptek.com for latest revision
Specifications subject to change without notice.
PART NUMBERING GUIDE
ES51C5 C 25 V - 13.000M TR
OPERATING TEMP. RANGE
One Letter Code Per Table 1
FREQUENCY STABILITY
Two Digit Code Per Table 1
EXTERNAL TRIM
N=None (No Connection on Pin 1)
V=Voltage Control
FREQUENCY
PACKAGING OPTIONS
Blank=Bulk
TR=Tape & Reel
Pin 1: Control Voltage or No Connection
Pin 2: Case Ground
Pin 3: Output
Pin 4: Supply Voltage
Characteristic
Specification
ESD Susceptibility
MIL-STD-883, Method 3015, Class 1, HBM: 1500V
Fine Leak Test
MIL-STD-883, Method 1014, Condition A
Flammability
UL94-V0
Gross Leak Test
MIL-STD-883, Method 1014, Condition C
Mechanical Shock
MIL-STD-883, Method 2002, Condition B
Moisture Resistance
MIL-STD-883, Method 1004
Moisture Sensitivity
J-STD-020, MSL 1
Resistance to Soldering Heat
MIL-STD-202, Method 210, Condition K
Resistance to Solvents
MIL-STD-202, Method 215
Solderability
MIL-STD-883, Method 2003
Temperature Cycling
MIL-STD-883, Method 1010, Condition B
Vibration
MIL-STD-883, Method 2007, Condition A
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