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參數(shù)資料
| 型號(hào)： | EPF6024ATC144-3N |
| 廠商： | Altera |
| 文件頁(yè)數(shù)： | 24/52頁(yè) |
| 文件大小： | 0K |
| 描述： | IC FLEX 6000 FPGA 24K 144-TQFP |
| 產(chǎn)品培訓(xùn)模塊： | Three Reasons to Use FPGA's in Industrial Designs |
| 標(biāo)準(zhǔn)包裝： | 180 |
| 系列： | FLEX 6000 |
| LAB/CLB數(shù)： | 196 |
| 邏輯元件/單元數(shù)： | 1960 |
| 輸入/輸出數(shù)： | 117 |
| 門(mén)數(shù)： | 24000 |
| 電源電壓： | 3 V ~ 3.6 V |
| 安裝類(lèi)型： | 表面貼裝 |
| 工作溫度： | -40°C ~ 100°C |
| 封裝/外殼： | 144-LQFP |
| 供應(yīng)商設(shè)備封裝： | 144-TQFP（20x20） |
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30
Altera Corporation
FLEX 6000 Programmable Logic Device Family Data Sheet
Generic Testing
Each FLEX 6000 device is functionally tested. Complete testing of each
configurable SRAM bit and all logic functionality ensures 100%
configuration yield. AC test measurements for FLEX 6000 devices are
made under conditions equivalent to those shown in Figure 17. Multiple
test patterns can be used to configure devices during all stages of the
production flow.
Figure 17. AC Test Conditions
Table 10. JTAG Timing Parameters & Values
Symbol
Parameter
Min
Max
Unit
tJCP
TCK
clock period
100
ns
tJCH
TCK
clock high time
50
ns
tJCL
TCK
clock low time
50
ns
tJPSU
JTAG port setup time
20
ns
tJPH
JTAG port hold time
45
ns
tJPCO
JTAG port clock-to-output
25
ns
tJPZX
JTAG port high impedance to valid output
25
ns
tJPXZ
JTAG port valid output to high impedance
25
ns
tJSSU
Capture register setup time
20
ns
tJSH
Capture register hold time
45
ns
tJSCO
Update register clock-to-output
35
ns
tJSZX
Update register high impedance to valid
output
35
ns
tJSXZ
Update register valid output to high
impedance
35
ns
VCC
To Test
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
464
(703
)
Device
Output
(8.06 k
)
[521
]
[481
]
250
Power supply transients can affect
AC measurements. Simultaneous
transitions of multiple outputs
should be avoided for accurate
measurement. Threshold tests must
not be performed under AC conditions.
Large-amplitude, fast-ground-current
transients normally occur as the
device outputs discharge the load
capacitances. When these transients
flow through the parasitic
inductance between the device
ground pin and the test system ground,
significant reductions in observable
noise immunity can result. Numbers
without parentheses are for 5.0-V
devices or outputs. Numbers in
parentheses are for 3.3-V devices or
outputs. Numbers in brackets are for
2.5-V devices or outputs.
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