參數(shù)資料
型號： EPF6024AFC256-1
廠商： ALTERA CORP
元件分類： PLD
英文描述： LOADABLE PLD, PBGA256
封裝： FINE LINE, BGA-256
文件頁數(shù)： 24/57頁
文件大?。?/td> 508K
代理商： EPF6024AFC256-1
30
Altera Corporation
FLEX 6000 Programmable Logic Device Family Data Sheet
Generic Testing
Each FLEX 6000 device is functionally tested. Complete testing of each
configurable SRAM bit and all logic functionality ensures 100%
configuration yield. AC test measurements for FLEX 6000 devices are
made under conditions equivalent to those shown in Figure 17. Multiple
test patterns can be used to configure devices during all stages of the
production flow.
Figure 17. AC Test Conditions
Table 10. JTAG Timing Parameters & Values
Symbol
Parameter
Min
Max
Unit
tJCP
TCK
clock period
100
ns
tJCH
TCK
clock high time
50
ns
tJCL
TCK
clock low time
50
ns
tJPSU
JTAG port setup time
20
ns
tJPH
JTAG port hold time
45
ns
tJPCO
JTAG port clock-to-output
25
ns
tJPZX
JTAG port high impedance to valid output
25
ns
tJPXZ
JTAG port valid output to high impedance
25
ns
tJSSU
Capture register setup time
20
ns
tJSH
Capture register hold time
45
ns
tJSCO
Update register clock-to-output
35
ns
tJSZX
Update register high impedance to valid
output
35
ns
tJSXZ
Update register valid output to high
impedance
35
ns
VCC
To Test
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
464
(703
)
Device
Output
(8.06 k
)
[521
]
[481
]
250
Power supply transients can affect
AC measurements. Simultaneous
transitions of multiple outputs
should be avoided for accurate
measurement. Threshold tests must
not be performed under AC conditions.
Large-amplitude, fast-ground-current
transients normally occur as the
device outputs discharge the load
capacitances. When these transients
flow through the parasitic
inductance between the device
ground pin and the test system ground,
significant reductions in observable
noise immunity can result. Numbers
without parentheses are for 5.0-V
devices or outputs. Numbers in
parentheses are for 3.3-V devices or
outputs. Numbers in brackets are for
2.5-V devices or outputs.
相關(guān)PDF資料
PDF描述
EPF6024AFC256-2 LOADABLE PLD, PBGA256
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EPF6024AFC256-3 LOADABLE PLD, PBGA256
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
EPF6024AFC256-2 功能描述:FPGA - 現(xiàn)場可編程門陣列 FPGA - Flex 6000 196 LABs 219 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EPF6024AFC256-2AA 制造商:Rochester Electronics LLC 功能描述:- Bulk
EPF6024AFC256-3 功能描述:FPGA - 現(xiàn)場可編程門陣列 FPGA - Flex 6000 196 LABs 219 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EPF6024AFI256-2 功能描述:IC FLEX 6000 FPGA 24K 256-FBGA RoHS:否 類別:集成電路 (IC) >> 嵌入式 - FPGA（現(xiàn)場可編程門陣列） 系列:FLEX 6000 產(chǎn)品變化通告:XC4000(E,L) Discontinuation 01/April/2002 標準包裝:24 系列:XC4000E/X LAB/CLB數(shù):100 邏輯元件/單元數(shù):238 RAM 位總計:3200 輸入/輸出數(shù):80 門數(shù):3000 電源電壓:4.5 V ~ 5.5 V 安裝類型:表面貼裝 工作溫度:-40°C ~ 100°C 封裝/外殼:120-BCBGA 供應(yīng)商設(shè)備封裝:120-CPGA（34.55x34.55）
EPF6024AQC208-1 功能描述:FPGA - 現(xiàn)場可編程門陣列 FPGA - Flex 6000 196 LABs 171 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
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