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參數(shù)資料
| 型號： | DS1001-7RD7T |
| 元件分類： | 電源模塊 |
| 英文描述： | 1-OUTPUT 100 W DC-DC REG PWR SUPPLY MODULE |
| 封裝： | HEAT SINK, METAL, CASE S02, MODULE |
| 文件頁數(shù)： | 29/31頁 |
| 文件大?。?/td> | 633K |
| 代理商： | DS1001-7RD7T |
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Cassette Style
100 Watt DC-DC Converters
S Series
Edition 1/01.2000
7/31
Electrical Output Data
General Conditions
–
TA = 25
°C, unless T
C is specified.
– Pin 18 (i) connected to pin 14 (S- / Vo1–),
Uo adjusted to Uo nom (option P), R input not connected.
– Sense line pins 12 (S+) and 14 (S–) connected to 4 (Vo1+) and 8 (Vo1–) respectively.
Table 4a: Output data single output modules AS/BS
Output
AS/BS 1001
AS/BS 1301
AS/BS 1501
AS/BS 1601
5.1 V
12.0 V
15.0 V
24.0 V
Characteristics
Conditions
min
typ max
min
typ max
min
typ max
min
typ
max
Unit
Uo
Output voltage
Ui nom, Io nom
5.07
5.13
11.93
12.07
14.91
15.09
23.86
24.14
V
Uo p
Overvoltage protection
7.6
21
26.5
43.5
(supressor diode)
Io nom
Output current 1
Ui min…Ui max
16.0
8.0
6.5
4.2
A
TC min…TC max
IoL
Output current limit 2
Ui min…Ui max
16.2
8.2
6.7
4.4
uo 5
Output
Switching freq.
Ui nom, Io nom
10
555
mVpp
voltage
Total
IEC/EN 61204
100
75
60
90
noise
BW = 20 MHz
DUo U Static line regulation
Ui min...Ui nom
±15
±25
±30
±30 mV
Ui nom...Ui max
Io nom
DUo I
Static load regulation
Ui nom, Io =
202530
40
(0.1…1)
Io nom
uo d 3
Dynamic Voltage
Ui nom, Io =
±100
±90
±100
±90
load
deviation
Io nom 1/2 Io nom
td 3
regulat.
Recovery time
IEC/EN 61204
0.3
0.4
ms
aUo
Temperature coefficient
Ui min...Ui max
–0.2
–1
–1mV/K
of output voltage 4
0...
Io nom
1 If the output voltages are increased above Uo nom through R-input control, option P setting, remote sensing or option T, the output cur-
rent should be reduced accordingly so that
Po nom is not exceeded.
2 See: Output voltage regulation of single output units.
3 See: Dynamic load regulation of U01.
4 Negative temperature coefficient (0...–3 mV/cell and K) available on request
5 Measured according to IEC/EN 61204 sub clause 3.10 with a probe according to annex A of the same standards. (see: Technical In-
formation: Measuring and Testing)
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