參數(shù)資料
型號(hào): CY7C291A-35DMB
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 2K x 8 Reprogrammable PROM
中文描述: 2K X 8 OTPROM, 35 ns, CDIP24
封裝: 0.300 INCH, CERDIP-24
文件頁(yè)數(shù): 3/12頁(yè)
文件大?。?/td> 275K
代理商: CY7C291A-35DMB
CY7C291A
Document #: 38-04011 Rev. *A
Page 3 of 12
Electrical Characteristics
Over the Operating Range
[2,3]
7C291A-20
7C291A-25
Parameter
Description
Test Conditions
Min.
Max.
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
CC
= Min., I
OH
=
4.0 mA
2.4
2.4
V
V
OL
Output LOW Voltage
V
CC
= Min., I
OL
= 16.0 mA
0.4
0.4
V
V
IH
Input HIGH Voltage
Guaranteed Input Logical
HIGH Voltage for All Inputs
2.0
V
CC
2.0
V
CC
V
V
IL
Input LOW Voltage
Guaranteed Input Logical
LOW Voltage for All Inputs
0.8
0.8
V
I
IX
Input Load Current
GND < V
IN
< V
CC
10
+10
10
+10
μ
A
V
CD
Input Diode Clamp Voltage
Note 3
I
OZ
Output Leakage Current
GND < V
OUT
< V
CC
,
Output Disabled
10
+10
10
+10
μ
A
I
OS
Output Short Circuit
Current
[4]
V
CC
= Max., V
OUT
= GND
20
90
20
90
mA
I
CC
V
CC
Operating Supply
Current
V
CC
= Max.,
I
OUT
= 0 mA
Com
l
120
90
mA
I
SB
Standby Supply Current
(7C293A Only)
V
CC
= Max.,
CS
1
= V
IH
Com
l
40
30
mA
V
PP
Programming Supply Voltage
12
13
12
13
V
I
PP
Programming Supply Current
50
50
mA
V
IHP
Input HIGH Programming
Voltage
3.0
3.0
V
V
ILP
Input LOW Programming
Voltage
0.4
0.4
V
Notes:
2.
3.
4.
See the last page of this specification for Group A subgroup testing information.
See the
Introduction to CMOS PROMs
section of the Cypress Data Book for general information on testing.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
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