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  • 參數(shù)資料
    型號: CY7C1355B-100BZC
    廠商: CYPRESS SEMICONDUCTOR CORP
    元件分類: DRAM
    英文描述: 9-Mb (256K x 36/512K x 18) Flow-Through SRAM with NoBL Architecture
    中文描述: 256K X 36 ZBT SRAM, 7.5 ns, PBGA165
    封裝: 13 X 15 MM, 1.20 MM HEIGHT, FBGA-165
    文件頁數(shù): 1/33頁
    文件大小: 560K
    代理商: CY7C1355B-100BZC
    9-Mb (256K x 36/512K x 18) Flow-Through
    SRAM with NoBL Architecture
    CY7C1355B
    CY7C1357B
    Cypress Semiconductor Corporation
    Document #: 38-05117 Rev. *B
    3901 North First Street
    San Jose
    ,
    CA 95134
    408-943-2600
    Revised January 27, 2004
    Features
    No Bus Latency (NoBL) architecture eliminates
    dead cycles between write and read cycles.
    Can support up to 133-MHz bus operations with zero
    wait states
    — Data is transferred on every clock
    Pin compatible and functionally equivalent to ZBT
    devices
    Internally self-timed output buffer control to eliminate
    the need to use OE
    Registered inputs for flow-through operation
    Byte Write capability
    3.3V/2.5V I/O power supply
    Fast clock-to-output times
    — 6.5 ns (for 133-MHz device)
    — 7.0 ns (for 117-MHz device)
    — 7.5 ns (for 100-MHz device)
    Clock Enable (CEN) pin to enable clock and suspend
    operation
    Synchronous self-timed writes
    Asynchronous Output Enable
    Offered in JEDEC-standard 100 TQFP, 119-Ball BGA and
    165-Ball fBGA packages
    Three chip enables for simple depth expansion.
    Automatic Power-down feature available using ZZ
    mode or CE deselect.
    JTAG boundary scan for BGA and fBGA packages
    Burst Capability—linear or interleaved burst order
    Low standby power
    Functional Description
    [1]
    The CY7C1355B/CY7C1357B is a 3.3V, 256K x 36/ 512K x 18
    Synchronous Flow-through Burst SRAM designed specifically
    to support unlimited true back-to-back Read/Write operations
    without
    the
    insertion
    CY7C1355B/CY7C1357B is equipped with the advanced No
    Bus Latency (NoBL) logic required to enable consecutive
    Read/Write operations with data being transferred on every
    clock cycle. This feature dramatically improves the throughput
    of data through the SRAM, especially in systems that require
    frequent Write-Read transitions.
    All synchronous inputs pass through input registers controlled
    by the rising edge of the clock. The clock input is qualified by
    the Clock Enable (CEN) signal, which when deasserted
    suspends operation and extends the previous clock cycle.
    Maximum access delay from the clock rise is 6.5 ns (133-MHz
    device).
    Write operations are controlled by the two or four Byte Write
    Select (BW
    X
    ) and a Write Enable (WE) input. All writes are
    conducted with on-chip synchronous self-timed write circuitry.
    Three synchronous Chip Enables (CE
    1
    , CE
    2
    , CE
    3
    ) and an
    asynchronous Output Enable (OE) provide for easy bank
    selection and output three-state control. In order to avoid bus
    contention, the output drivers are synchronously three-stated
    during the data portion of a write sequence.
    of
    wait
    states.
    The
    Selection Guide
    133 MHz
    6.5
    250
    30
    117 MHz
    7.0
    220
    30
    100 MHz
    7.5
    180
    30
    Unit
    ns
    mA
    mA
    Maximum Access Time
    Maximum Operating Current
    Maximum CMOS Standby Current
    Note:
    1. For best-practices recommendations, please refer to the Cypress application note
    System Design Guidelines
    on www.cypress.com.
    相關(guān)PDF資料
    PDF描述
    CY7C1355B-100BZI 9-Mb (256K x 36/512K x 18) Flow-Through SRAM with NoBL Architecture
    CY7C1355B-117AC 9-Mb (256K x 36/512K x 18) Flow-Through SRAM with NoBL Architecture
    CY7C1355B-117AI 9-Mb (256K x 36/512K x 18) Flow-Through SRAM with NoBL Architecture
    CY7C1355B-117BGC 9-Mb (256K x 36/512K x 18) Flow-Through SRAM with NoBL Architecture
    CY7C1355B-117BGI 9-Mb (256K x 36/512K x 18) Flow-Through SRAM with NoBL Architecture
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    參數(shù)描述
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