參數(shù)資料
型號(hào): CY7C1353F-100AI
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 4-Mb (256K x 18) Flow-through SRAM with NoBL Architecture
中文描述: 256K X 18 ZBT SRAM, 8 ns, PQFP100
封裝: 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
文件頁數(shù): 9/13頁
文件大小: 324K
代理商: CY7C1353F-100AI
CY7C1353F
Document #: 38-05212 Rev. *B
Page 9 of 13
Switching Characteristics
Over the Operating Range
[16, 17]
Parameter
t
POWER
Clock
t
CYC
t
CH
t
CL
Output Times
t
CDV
t
DOH
t
CLZ
t
CHZ
t
OEV
t
OELZ
t
OEHZ
Set-up Times
t
AS
t
ALS
t
WES
t
CENS
t
DS
t
CES
Hold Times
t
AH
t
ALH
t
WEH
t
CENH
t
DH
t
CEH
Shaded areas contain advance information.
Description
133 MHz
Min.
1
117 MHz
Min.
1
100 MHz
Min.
1
66 MHz
Min.
1
Unit
ms
Max.
Max.
Max.
Max.
V
DD
(Typical) to the first Access
[12]
Clock Cycle Time
Clock HIGH
Clock LOW
7.5
2.5
2.5
8.5
3.0
3.0
10
4.0
4.0
15
5.0
5.0
ns
ns
ns
Data Output Valid After CLK Rise
Data Output Hold After CLK Rise
Clock to Low-Z
[13, 14, 15]
Clock to High-Z
13, 14, 15]
6.5
7.5
8.0
11.0
ns
ns
ns
ns
ns
ns
ns
2.0
0
2.0
0
2.0
0
2.0
0
3.5
3.5
3.5
3.5
3.5
3.5
5.0
6.0
OE LOW to Output Valid
OE LOW to Output Low-Z
[13, 14, 15]
OE HIGH to Output High-Z
[13, 14, 15]
0
0
0
0
3.5
3.5
3.5
6.0
Address Set-up Before CLK Rise
1.5
1.5
1.5
1.5
1.5
1.5
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
ns
ns
ns
ns
ns
ns
ADV/LD Set-up Before CLK Rise
WE, BW
[A:B]
Set-Up Before CLK Rise
CEN Set-up Before CLK Rise
Data Input Set-up Before CLK Rise
Chip Enable Set-Up Before CLK Rise
Address Hold After CLK Rise
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
ns
ns
ns
ns
ns
ns
ADV/LD Hold after CLK Rise
WE, BW
[A:B]
Hold After CLK Rise
CEN Hold After CLK Rise
Data Input Hold After CLK Rise
Chip Enable Hold After CLK Rise
Notes:
12.This part has a voltage regulator internally; t
power
is the time that the power needs to be supplied above V
DD
minimum initially before a read or write operation
can be initiated.
13.t
, t
,t
, and t
are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.
14.At any given voltage and temperature, t
is less than t
and t
is less than t
to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve Three-state prior to Low-Z under the same system conditions.
15.This parameter is sampled and not 100% tested.
16.Timing reference level is 1.5V when V
=3.3V and is 1.25V when V
DDQ
=2.5V.
17.Test conditions shown in (a) of AC Test Loads, unless otherwise noted.
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