參數(shù)資料
型號： CY74FCT827ATSOCTE4
廠商： Texas Instruments
文件頁數(shù)： 5/11頁
文件大小： 0K
描述： IC BUFFER TRI-ST 10BIT 24SOICW
標(biāo)準(zhǔn)包裝： 2,000
系列： 74FCT
邏輯類型： 緩沖器/線路驅(qū)動器，非反相
元件數(shù)： 1
每個元件的位元數(shù)： 10
輸出電流高，低： 32mA，64mA
電源電壓： 4.75 V ~ 5.25 V
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 24-SOIC（0.295"，7.50mm 寬）
供應(yīng)商設(shè)備封裝： 24-SOIC
包裝： 帶卷 (TR)
CY54FCT827T, CY74FCT827T
10-BIT BUFFERS
WITH 3-STATE OUTPUTS
SCCS034A – SEPTEMBER 1994 – REVISED OCTOBER 2001
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 2)
CY54FCT827T
CY74FCT827T
UNIT
MIN
NOM
MAX
MIN
NOM
MAX
UNIT
VCC
Supply voltage
4.5
5
5.5
4.75
5
5.25
V
VIH
High-level input voltage
2
V
VIL
Low-level input voltage
0.8
V
IOH
High-level output current
–12
–32
mA
IOL
Low-level output current
32
64
mA
TA
Operating free-air temperature
–55
125
–40
85
°C
NOTE 2: All unused inputs of the device must be held at VCC or GND to ensure proper device operation.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
CY54FCT827T
CY74FCT827T
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
TYP
MAX
UNIT
VIK
VCC = 4.5 V,
IIN = –18 mA
–0.7
–1.2
V
VIK
VCC = 4.75 V,
IIN = –18 mA
–0.7
–1.2
V
VCC = 4.5 V,
IOH = –12 mA
2.4
3.3
VOH
VCC 475 V
IOH = –32 mA
2
V
VCC = 4.75 V
IOH = –15 mA
2.4
3.3
VOL
VCC = 4.5 V,
IOL = 32 mA
0.3
0.55
V
VOL
VCC = 4.75 V,
IOL = 64 mA
0.3
0.55
V
Vhys
All inputs
0.2
V
II
VCC = 5.5 V,
VIN = VCC
5
A
II
VCC = 5.25 V,
VIN = VCC
5
A
IIH
VCC = 5.5 V,
VIN = 2.7 V
±1
A
IIH
VCC = 5.25 V,
VIN = 2.7 V
±1
A
IIL
VCC = 5.5 V,
VIN = 0.5 V
±1
A
IIL
VCC = 5.25 V,
VIN = 0.5 V
±1
A
IOZH
VCC = 5.5 V,
VOUT = 2.7 V
10
A
IOZH
VCC = 5.25 V,
VOUT = 2.7 V
10
A
IOZL
VCC = 5.5 V,
VOUT = 0.5 V
–10
A
IOZL
VCC = 5.25 V,
VOUT = 0.5 V
–10
A
IOS
VCC = 5.5 V,
VOUT = 0 V
–60
–120
–225
mA
IOS
VCC = 5.25 V,
VOUT = 0 V
–60
–120
–225
mA
Ioff
VCC = 0 V,
VOUT = 4.5 V
±1
A
ICC
VCC = 5.5 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
ICC
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
ICC
VCC = 5.5 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.5
2
mA
ICC
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.5
2
mA
Typical values are at VCC = 5 V, TA = 25°C.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or
sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence
of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
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