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參數(shù)資料
型號： CY74FCT2244ATSOC
廠商： Texas Instruments
文件頁數(shù)： 10/15頁
文件大小： 0K
描述： IC BUFF/DVR TRI-ST 8BIT 20SOICW
標準包裝： 25
系列： 74FCT
邏輯類型： 緩沖器/線路驅(qū)動器，非反相
元件數(shù)： 2
每個元件的位元數(shù)： 4
輸出電流高，低： 15mA，12mA
電源電壓： 4.75 V ~ 5.25 V
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 20-SOIC（0.295"，7.50mm 寬）
供應(yīng)商設(shè)備封裝： 20-SOIC
包裝： 管件
其它名稱： 296-33211-5
CY74FCT2244ATSOC-ND
CY74FCT2244T
8-BIT BUFFER/LINE DRIVER
WITH 3-STATE OUTPUTS
SCCS074 – OCTOBER 2001
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIK
VCC = 4.75 V,
IIN = –18 mA
–0.7
–1.2
V
VOH
VCC = 4.75 V,
IOH = –15 mA
2.4
3.3
V
VOL
VCC = 4.75 V,
IOL = 12 mA
0.3
0.55
V
ROUT
VCC = 4.75 V,
IOL = 12 mA
20
25
40
Vhys
All inputs
0.2
V
II
VCC = 5.25 V,
VIN = VCC
5
A
IIH
VCC = 5.25 V,
VIN = 2.7 V
±1
A
IIL
VCC = 5.25 V,
VIN = 0.5 V
±1
A
IOZH
VCC = 5.25 V,
VOUT = 2.7 V
10
A
IOZL
VCC = 5.25 V,
VOUT = 0.5 V
–10
A
IOS
VCC = 5.25 V,
VOUT = 0 V
–60
–120
–225
mA
Ioff
VCC = 0 V,
VOUT = 4.5 V
±1
A
ICC
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
ICC
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.5
2
mA
ICCD
VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open,
OEA = OEB = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
0.06
0.12
mA/
MHz
#
One bit switching
at f1 = 10 MHz
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
0.7
1.4
IC#
VCC = 5.25 V,
Outputs open
1
at 50% duty cycle
VIN = 3.4 V or GND
1
2.4
mA
IC#
Outputs open,
OEA = OEB = GND
Eight bits switching
at f1 = 2.5 MHz
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
1.3
2.6||
mA
1
at 50% duty cycle
VIN = 3.4 V or GND
3.3
10.6||
Ci
5
10
pF
Co
9
12
pF
Typical values are at VCC = 5 V, TA = 25°C.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
This parameter is derived for use in total power-supply calculations.
# IC
= ICC + ICC × DH × NT + ICCD (f0/2 + f1 × N1)
Where:
IC
= Total supply current
ICC
= Power-supply current with CMOS input levels
ICC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH
= Duty cycle for TTL inputs high
NT
= Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0
= Clock frequency for registered devices, otherwise zero
f1
= Input signal frequency
N1
= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| Values for these conditions are examples of the ICC formula.
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