參數(shù)資料
型號: CY62137VLL-55ZI
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 2-Mbit (128K x 16) Static RAM
中文描述: 128K X 16 STANDARD SRAM, 55 ns, PDSO44
封裝: TSOP2-44
文件頁數(shù): 5/11頁
文件大?。?/td> 214K
代理商: CY62137VLL-55ZI
CY62137V MoBL
Document #: 38-05051 Rev. *B
Page 5 of 11
Switching Characteristics
Over the Operating Range
[6]
Parameter
Description
55 ns
70 ns
Unit
Min.
Max.
Min.
Max.
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE (9)
t
HZBE
Write Cycle
[10, 11]
Read Cycle Time
55
70
ns
Address to Data Valid
55
70
ns
Data Hold from Address Change
10
10
ns
CE LOW to Data Valid
55
70
ns
OE LOW to Data Valid
OE LOW to Low-Z
[7]
OE HIGH to High-Z
[7, 8]
CE LOW to Low-Z
[7]
CE HIGH to High-Z
[7, 8]
25
35
ns
5
5
ns
25
25
ns
10
10
ns
25
25
ns
CE LOW to Power-up
0
0
ns
CE HIGH to Power-down
55
70
ns
BHE / BLE LOW to Data Valid
55
70
ns
BHE / BLE LOW to Low-Z
5
5
ns
BHE / BLE HIGH to High-Z
25
25
ns
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
HZWE
t
LZWE
t
BW
Write Cycle Time
55
70
ns
CE LOW to Write End
45
60
ns
Address Set-up to Write End
45
60
ns
Address Hold from Write End
0
0
ns
Address Set-up to Write Start
0
0
ns
WE Pulse Width
40
50
ns
Data Set-up to Write End
25
30
ns
Data Hold from Write End
WE LOW to High-Z
[7, 8]
WE HIGH to Low-Z
[7]
0
0
ns
20
25
ns
5
10
ns
BHE / BLE LOW to End of Write
50
60
ns
Notes:
6.
Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input levels of 0 to V
CC
typ., and output loading of the specified
I
/I
and 30 pF load capacitance.
At any given temperature and voltage condition, t
is less than t
, t
is less than t
, and t
is less than t
for any given device.
t
, t
, and t
are specified with C
= 5 pF as in (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
If both byte enables are toggled together this value is 10 ns.
9.
a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
11.
The minimum write cycle time for write cycle #3 (WE controlled, OE LOW) is the sum of t
HZWE
and t
SD
.
7.
8.
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