
CY54/74FCT163T
2
Maximum Ratings
[2,3]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature
.....................................
65
°
C to +150
°
C
Ambient Temperature with
Power Applied
..................................................
65
°
C to +135
°
C
Supply Voltage to Ground Potential
..................
0.5V to +7.0V
DC Input Voltage
.................................................
0.5V to +7.0V
DC Output Voltage
..............................................
0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Function Table
[1]
Inputs
PE
X
L
H
H
H
Action on the Rising
Clock Edge(s)
Reset (Clear)
Load (P
n
Q
n
)
Count (Incremental)
No Charge (Hold)
No Charge (Hold)
SR
L
H
H
H
H
CET
X
X
H
L
X
CEP
X
X
H
X
L
Pin Description
Name
CEP
CET
CP
SR
P
PE
Q
TC
Description
Count Enable Parallel Input
Count Enable Trickle Input
Clock Pulse Input (Active Rising Edge)
Synchronous Reset Input (Active LOW)
Parallel Data Inputs
Parallel Enable Input (Active LOW)
Flip-Flop Outputs
Terminal Count Output
Operating Range
Range
Commercial
Military
[4]
Range
All
All
Ambient
Temperature
40
°
C to +85
°
C
55
°
C to +125
°
C
V
CC
5V
±
5%
5V
±
10%
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
Description
Test Conditions
Min.
2.0
2.4
2.4
Typ.
[5]
Max.
Unit
V
V
V
V
V
V
V
V
V
μ
A
μ
A
μ
A
mA
μ
A
Output HIGH Voltage
V
CC
=Min., I
OH
=
32 mA
V
CC
=Min., I
OH
=
15 mA
V
CC
=Min., I
OH
=
12 mA
V
CC
=Min., I
OL
=64 mA
V
CC
=Min., I
OL
=32 mA
Com’l
Com’l
Mil
Com’l
Mil
3.3
3.3
0.3
0.3
V
OL
Output LOW Voltage
0.55
0.55
V
IH
V
IL
V
H
V
IK
I
I
I
IH
I
IL
I
OS
I
OFF
Notes:
1.
2.
3.
4.
5.
6.
7.
Input HIGH Voltage
Input LOW Voltage
Hysteresis
[6]
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current
Input LOW Current
Output Short Circuit Current
[7]
Power-Off Disable
2.0
0.8
All inputs
V
CC
=Min., I
IN
=
18 mA
V
CC
=Max., V
IN
=V
CC
V
CC
=Max., V
IN
=2.7V
V
CC
=Max., V
IN
=0.5V
V
CC
=Max., V
OUT
=0.0V
V
CC
=0V, V
OUT
=4.5V
0.2
0.7
1.2
5
±
1
±
1
225
±
1
60
120
H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.
Unless otherwise noted, these limits are over the operating free-air temperature range.
Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
T
is the “instant on” case temperature.
Typical values are at V
=5.0V, T
=+25C ambient.
This parameter is specified but not tested.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.