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| 型號： | CY5474FCT138T |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 1-of-8 Decoder |
| 中文描述： | 1 - 8解碼器 |
| 文件頁數(shù)： | 4/7頁 |
| 文件大小： | 107K |
| 代理商： | CY5474FCT138T |
CY54FCT138T, CY74FCT138T
1-OF-8 DECODERS
SCCS013B
–
MAY 1994
–
REVISED OCTOBER 2001
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 2)
CY54FCT138T
MIN
NOM
CY74FCT138T
MIN
NOM
UNIT
MAX
MAX
VCC
VIH
VIL
IOH
IOL
TA
NOTE 2: All unused inputs of the device must be held at VCC or GND to ensure proper device operation.
Supply voltage
4.5
5
5.5
4.75
5
5.25
V
High-level input voltage
2
2
V
Low-level input voltage
0.8
0.8
V
High-level output current
–
12
–
32
mA
Low-level output current
32
64
mA
°
C
Operating free-air temperature
–
55
125
–
40
85
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
CY54FCT138T
MIN
TYP
CY74FCT138T
MIN
TYP
UNIT
MAX
–
1.2
MAX
VIK
VCC = 4.5 V,
VCC = 4.75 V,
VCC = 4.5 V,
IIN =
–
18 mA
IIN =
–
18 mA
IOH =
–
12 mA
IOH =
–
32 mA
IOH =
–
15 mA
IOL = 32 mA
IOL = 64 mA
–
0.7
V
–
0.7
–
1.2
2.4
3.3
VOH
VCC= 4 75 V
VCC = 4.75 V
2
V
2.4
3.3
VOL
VCC = 4.5 V,
VCC = 4.75 V,
All inputs
0.3
0.55
V
0.3
0.55
Vhys
0.2
0.2
V
II
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 0 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 5.5 V, VIN = 3.4 V
§
, f1 = 0, Outputs open
VCC = 5.25 V, VIN = 3.4 V
§
, f1 = 0, Outputs open
VCC = 5.5 V, Outputs open, One bit switching at 50% duty
cycle, VIN
≤
0.2 V or VIN
≥
VCC
–
0.2 V
VCC = 5.25 V, Outputs open, One bit switching at 50%
duty cycle, VIN
≤
0.2 V or VIN
≥
VCC
–
0.2 V
Typical values are at VCC = 5 V, TA = 25
°
C.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§
Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
This parameter is derived for use in total power-supply calculations.
VIN = VCC
VIN = VCC
VIN = 2.7 V
VIN = 2.7 V
VIN = 0.5 V
VIN = 0.5 V
VOUT = 0 V
VOUT = 0 V
VOUT = 4.5 V
VIN
≤
0.2 V,
VIN
≤
0.2 V,
5
μ
A
5
IIH
±
1
μ
A
±
1
IIL
±
1
μ
A
±
1
IOS
–
60
–
120
–
225
mA
–
60
–
120
–
225
Ioff
±
1
0.2
±
1
μ
A
ICC
VIN
≥
VCC
–
0.2 V
VIN
≥
VCC
–
0.2 V
0.1
mA
0.1
0.2
ICC
0.5
2
mA
0.5
2
0.06
0.12
mA/
MHz
ICCD
0.06
0.12
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