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| 型號： | CY37192VP160-100AXC |
| 廠商： | CYPRESS SEMICONDUCTOR CORP |
| 元件分類： | PLD |
| 英文描述： | 5V, 3.3V, ISRTM High-Performance CPLDs |
| 中文描述： | EE PLD, 12 ns, PQFP160 |
| 封裝： | 24 X 24 MM, 1.4 MM HEIGHT, LEAD FREE, PLASTIC, TQFP-160 |
| 文件頁數(shù)： | 14/64頁 |
| 文件大?。?/td> | 1798K |
| 代理商： | CY37192VP160-100AXC |
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Ultra37000 CPLD Family
Document #: 38-03007 Rev. *D
Page 14 of 64
5.0V Device Characteristics
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage to Ground Potential...............–0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State................................................–0.5V to +7.0V
DC Input Voltage ............................................–0.5V to +7.0V
DC Program Voltage.............................................4.5 to 5.5V
Current into Outputs....................................................16 mA
Static Discharge Voltage...........................................> 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current.....................................................> 200 mA
Operating Range
[2]
Range
Ambient Temperature
[2]
0°C to +70°C
Junction Temperature
0°C to +90°C
Output Condition
5V
3.3V
5V
3.3V
5V
3.3V
V
CC
V
CCO
Commercial
5V
±
0.25V
5V
±
0.25V
5V
±
0.5V
5V
±
0.5V
5V
±
0.5V
5V
±
0.5V
5V
±
0.25V
3.3V
±
0.3V
5V
±
0.5V
3.3V
±
0.3V
±
0.5V
3.3V
±
0.3V
Industrial
–40°C to +85°C
–40°C to +105°C
Military
[3]
–55°C to +125°C
–55°C to +130°C
5.0V Device Electrical Characteristics
Over the Operating Range
Parameter
V
OH
Description
Test Conditions
Min. Typ.
2.4
2.4
Max.
Unit
V
V
V
V
V
V
V
V
V
V
μ
A
μ
A
mA
μ
A
Output HIGH Voltage
V
CC
= Min.
I
OH
= –3.2 mA (Com’l/Ind)
[4]
I
OH
= –2.0 mA (Mil)
[4]
I
OH
= 0
μ
A (Com’l)
[6]
I
OH
= 0
μ
A (Ind/Mil)
[6]
I
OH
= –100
μ
A (Com’l)
[6]
I
OH
= –150
μ
A (Ind/Mil)
[6]
I
OL
= 16 mA (Com’l/Ind)
[4]
I
OL
= 12 mA (Mil)
[4]
V
OHZ
Output HIGH Voltage with
Output Disabled
[5]
V
CC
= Max.
4.2
4.5
3.6
3.6
0.5
0.5
V
OL
Output LOW Voltage
V
CC
= Min.
V
IH
V
IL
I
IX
I
OZ
I
OS
I
BHL
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Leakage Current
Output Short Circuit Current
[8, 5]
V
CC
= Max., V
OUT
= 0.5V
Input Bus-Hold LOW
Sustaining Current
Input Bus-Hold HIGH
Sustaining Current
Input Bus-Hold LOW
Overdrive Current
Input Bus-Hold HIGH
Overdrive Current
Guaranteed Input Logical HIGH Voltage for all Inputs
[7]
Guaranteed Input Logical LOW Voltage for all Inputs
[7]
V
I
= GND OR V
CC
, Bus-Hold Disabled
V
O
= GND or V
CC
, Output Disabled, Bus-Hold Disabled
2.0
–0.5
–10
–50
–30
+75
V
CCmax
0.8
10
50
–160
V
CC
= Min., V
IL
= 0.8V
I
BHH
V
CC
= Min., V
IH
= 2.0V
–75
μ
A
I
BHLO
V
CC
= Max.
+500
μ
A
I
BHHO
V
CC
= Max.
–500
μ
A
Notes:
2. Normal Programming Conditions apply across Ambient Temperature Range for specified programming methods. For more information on programming the
Ultra37000 Family devices, please refer to the Application Note titled “An Introduction to In System Reprogramming with the Ultra37000.”
3. T
A
is the “Instant On” case temperature.
4. I
= –2
mA, I
= 2 mA for TDO.
5. Tested initially and after any design or process changes that may affect these parameters.
6. When the I/O is output disabled, the bus-hold circuit can weakly pull the I/O to above 3.6V if no leakage current is allowed. Note that all I/Os are output disabled
during ISR programming. Refer to the application note “Understanding Bus-Hold” for additional information.
7. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
8. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. V
OUT
= 0.5V has been chosen to avoid test
problems caused by tester ground degradation.
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