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參數(shù)資料
| 型號(hào)： | CL321611T-5R6M-S |
| 廠商： | YAGEO CORP |
| 元件分類： | 通用定值電感 |
| 英文描述： | 1 ELEMENT, 5.6 uH, FERRITE-CORE, GENERAL PURPOSE INDUCTOR, SMD |
| 封裝： | CHIP, 1206 |
| 文件頁數(shù)： | 3/12頁 |
| 文件大?。?/td> | 263K |
| 代理商： | CL321611T-5R6M-S |
62
Cl seRIes RelIaBIlITY TesT
1-1 MeChanICal peRFORManCe
NO.
ITEM
SPECIFICATION
TEST CONDITIONS
1-1-1
Flexure Strength
Appearance : No Damage
Test device shall be soldered on the substrate.
L Change : within ±10%
Substrate Dimension : 100 x 40 x 1.6mm
Q Change : within ±30%
Deflection : 2.0mm
Keeping Time : 30Sec.
* For 100505, substrate dimension is 100 x 40 x 0.8mm.
1-1-2
Vibration
Test device shall be soldered on the substrate.
Oscillation Frequency : 10 to 55 to 10Hz for 1Min.
Amplitude : 1.5mm
Time : 2Hrs. for each Axis (X,Y & Z), Total 6Hrs.
1-1-3
Resistance to
Appearance : No Damage
Pre-heating : 150°C, 1Min.
Soldering Heat
Solder Composition : Sn/Pb = 63/37
Solder Temperature : 260 ± 5°C
Immersion Time : 10 ± 1Sec.
1-1-4
Solderability
The electrodes shall be at least 90% covered
Pre-heating : 150°C, 1Min.
with new solder coating.
Solder Composition : Sn/Pb = 63/37
Solder Temperature : 230 ± 5°C
Immersion Time : 4 ±1Sec.
1-2 enVIROnMenTal peRFORManCe
NO.
ITEM
SPECIFICATION
TEST CONDITIONS
1-2-1
Temperature Cycle
Appearance : No Damage
One Cycle
L Change : within ±10%
Step
Temperature (°C)
Time (Min.)
Q Change : within ±30%
1
-25 ± 3
30
2
25 ± 2
3
85 ± 3
30
4
25 ± 2
3
Total : 100 Cycles
Measured after Exposure in the Room Condition for 24Hrs.
1-2-2
Humidity Resistance
Temperature : 40 ± 2°C
Relative Humidity : 90 ~ 95%
Time : 1000Hrs.
Measured after Exposure in the Room Condition for 24Hrs.
1-2-3
High Temperature
Temperature : 85 ± 3°C
Resistance
Relative Humidity : 20%
Applied Current : Rated Current
Time : 1000Hrs.
Measured after Exposure in the Room Condition for 24Hrs.
1-2-4
Low Temperature
Temperature : -25 ± 3°C
Resistance
Relative Humidity : 0%
Time : 1000Hrs.
Measured after Exposure in the Room Condition for 24Hrs.
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