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參數(shù)資料
| 型號(hào)： | CD-700-LAC-GCB-XX.XXX |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | Complete VCXO Based Phase Lock Loop |
| 中文描述： | 基于完整的石英振蕩器鎖相環(huán) |
| 文件頁(yè)數(shù)： | 3/14頁(yè) |
| 文件大?。?/td> | 147K |
| 代理商： | CD-700-LAC-GCB-XX.XXX |
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CD-700, VCXO Based PLL
Vectron International, 267 Lowell Rd, Hudson NH 03051-4916
Tel:1-88-VECTRON-1 Website: www.vectron.com
Page 3 of 14
Rev : 06Jul05
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional
operation is not implied at these or any other conditions in excess of conditions represented in the
operational sections of this data sheet. Exposure to absolute maximum ratings for extended periods may
adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Symbol
Power Supply
V
DD
Storage Temperature
Tstorage
Clock and Data Input Range
CLKIN, DATAIN
Reliability
The CD-700 is capable of meeting the following qualification tests.
Ratings
7
-55/125
Unit
Vdc
°
C
V
Gnd-0.5 to V
DD
+0.5
Table 3. Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross and Fine Leak
Resistance to Solvents
Handling Precautions
Although ESD protection circuitry has been designed into the the CD-700, proper precautions should be
taken when handling and mounting. VI employs a Human Body Model (HBM) and a Charged Device
Model (CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are
dependent on the circuit parameters used to define the model.
Table 4. Predicted ESD Ratings
Model
Minimum
Human Body Model
1500 V
Charged Device Model
1000 V
Conditions
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014, 100% Tested
MIL-STD-883, Method 2016
Conditions
MIL-STD 883, Method 3015
JESD 22-C101
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