參數(shù)資料
型號: CAT93C46YI-GT3
英文描述: 1-Kb Microwire Serial EEPROM
中文描述: 1 - KB的微型導(dǎo)線串行EEPROM
文件頁數(shù): 2/15頁
文件大?。?/td> 136K
代理商: CAT93C46YI-GT3
CAT93C46
2
Doc No. 1106, Rev. F
2007 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +5.5V, T
A
=-40
°
C to +85
°
C, unless otherwise specified.
Symbol
Parameter
I
CC1
Power Supply Current
(Write)
Test Conditions
f
SK
= 1MHz
V
CC
= 5.0V
Min
Max
1
Units
mA
I
CC2
Power Supply Current
(Read)
f
SK
= 1MHz
V
CC
= 5.0V
500
μ
A
I
SB1
Power Supply Current
(Standby) (x8 Mode)
V
IN
=GND or V
CC,
CS =GND
ORG=GND
2
μ
A
I
SB2
Power Supply Current
(Standby) (x16Mode)
V
IN
=GND or V
CC,
CS =GND
ORG=Float or V
CC
1
μ
A
I
LI
Input Leakage Current
V
IN
= GND to V
CC
1
μ
A
μ
A
I
LO
Output Leakage Current
V
OUT
= GND to V
CC
,
CS = GND
1
V
IL1
Input Low Voltage
4.5V
V
CC
< 5.5V
4.5V
V
CC
< 5.5V
1.8V
V
CC
< 4.5V
1.8V
V
CC
< 4.5V
4.5V
V
CC
< 5.5V
I
OL
= 2.1mA
-0.1
0.8
V
V
IH1
Input High Voltage
2
V
CC
+ 1
V
V
IL2
Input Low Voltage
0
V
CC
x 0.2
V
V
IH2
Input High Voltage
V
CC
x 0.7
V
CC
+1
V
V
OL1
Output Low Voltage
0.4
V
V
OH1
Output High Voltage
4.5V
V
CC
< 5.5V
I
OH
= -400
μ
A
1.8V
V
CC
< 4.5V
I
OL
= 1mA
2.4
V
V
OL2
Output Low Voltage
0.2
V
V
OH2
Output High Voltage
1.8V
V
CC
< 4.5V
I
OH
= -100
μ
A
V
CC
- 0.2
V
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The DC input voltage on any pin should not be lower than -0.5V or higher than V
CC
+0.5V. During transitions, the voltage on any pin may
undershoot to no less than -1.5V or overshoot to no more than V
CC
+1.5V, for periods of less than 20 ns.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
(4) Block Mode, V
CC
= 5V, 25
°
C
ABSOLUTE MAXIMUM RATINGS
(1)
Storage Temperature
-65
°
C to +150
°
C
Voltage on Any Pin with Respect to Ground
(2)
-0.5 V to +6.5 V
RELIABILITY CHARACTERISTICS
(3)
l
b
m
y
N
S
r
e
m
n
a
d
R
a
D
a
r
a
n
P
E
n
0
0
0
1
M
s
U
a
E
/
s
e
Y
D
N
E
T
)
e
o
c
0
0
0
s
e
y
C
e
s
m
a
o
P
R
D
n
e
0
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