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    參數(shù)資料
    型號(hào): CAT24WC16WA-1.8TE13F
    英文描述: 1K/2K/4K/8K/16K-Bit Serial E2PROM
    中文描述: 1K/2K/4K/8K/16K-Bit串行E2PROM
    文件頁數(shù): 2/7頁
    文件大小: 92K
    代理商: CAT24WC16WA-1.8TE13F
    CAT24C01B
    2
    Doc. No. 25085-00 7/99 S-1
    ABSOLUTE MAXIMUM RATINGS*
    Temperature Under Bias ................. –55
    °C to +125°C
    Storage Temperature ....................... –65
    °C to +150°C
    Voltage on Any Pin with
    Respect to Ground(1) ........... –2.0V to +VCC + 2.0V
    VCC with Respect to Ground ............... –2.0V to +7.0V
    Package Power Dissipation
    Capability (Ta = 25
    °C) .................................. 1.0W
    Lead Soldering Temperature (10 secs) ............ 300
    °C
    Output Short Circuit Current(2) ........................ 100mA
    *COMMENT
    Stresses above those listed under “Absolute Maximum
    Ratings” may cause permanent damage to the device.
    These are stress ratings only, and functional operation of
    the device at these or any other conditions outside of those
    listed in the operational sections of this specification is not
    implied. Exposure to any absolute maximum rating for
    extended periods may affect device performance and
    reliability.
    RELIABILITY CHARACTERISTICS
    Symbol
    Parameter
    Min.
    Max.
    Units
    Reference Test Method
    NEND(3)
    Endurance
    1,000,000
    Cycles/Byte
    MIL-STD-883, Test Method 1033
    TDR(3)
    Data Retention
    100
    Years
    MIL-STD-883, Test Method 1008
    VZAP(3)
    ESD Susceptibility
    2000
    Volts
    MIL-STD-883, Test Method 3015
    ILTH(3)(4)
    Latch-up
    100
    mA
    JEDEC Standard 17
    D.C. OPERATING CHARACTERISTICS
    VCC = +1.8V to +6.0V, unless otherwise specified.
    Limits
    Symbol
    Parameter
    Min.
    Typ.
    Max.
    Units
    Test Conditions
    ICC
    Power Supply Current
    3
    mA
    fSCL = 100 KHz
    ISB(5)
    Standby Current (VCC = 5.0V)
    0
    AVIN = GND or VCC
    ILI
    Input Leakage Current
    10
    AVIN = GND to VCC
    ILO
    Output Leakage Current
    10
    AVOUT = GND to VCC
    VIL
    Input Low Voltage
    –1
    VCC x 0.3
    V
    VIH
    Input High Voltage
    VCC x 0.7
    VCC + 0.5
    V
    VOL1
    Output Low Voltage (VCC = 3.0V)
    0.4
    V
    IOL = 3 mA
    VOL2
    Output Low Voltage (VCC = 1.8V)
    0.5
    V
    IOL = 1.5 mA
    Note:
    (1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
    voltage on output pins is VCC +0.5V, which may overshoot to VCC + 2.0V for periods of less than 20ns.
    (2) Output shorted for no more than one second. No more than one output shorted at a time.
    (3) This parameter is tested initially and after a design or process change that affects the parameter.
    (4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
    (5) Standby Current (ISB) = 0A (<900nA).
    CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5V
    Symbol
    Test
    Max.
    Units
    Conditions
    CI/O(3)
    Input/Output Capacitance (SDA)
    8
    pF
    VI/O = 0V
    CIN(3)
    Input Capacitance (A0, A1, A2, SCL, WP)
    6
    pF
    VIN = 0V
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