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參數(shù)資料
| 型號(hào)： | CAT24FC256GWETE13 |
| 元件分類(lèi)： | EEPROM |
| 英文描述： | 256K-Bit I2C Serial CMOS EEPROM |
| 中文描述： | 256K位I2C串行CMOS EEPROM的 |
| 文件頁(yè)數(shù)： | 2/12頁(yè) |
| 文件大?。?/td> | 647K |
| 代理商： | CAT24FC256GWETE13 |
DsconinuedPat
C
I/O(3)
Input/Output Capacitance (SDA)
V
I/O
= 0V
CAT24FC256
2
Doc. No. 1040, Rev. K
2005 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias .................
–
55
°
C to +125
°
C
Storage Temperature.......................
–
65
°
C to +150
°
C
Voltage on Any Pin with
Respect to Ground
(1)
...........
–
2.0V to +V
CC
+ 2.0V
V
CC
with Respect to Ground ...............
–
2.0V to +7.0V
Capability (T
A
= 25
°
C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300
°
C
Output Short Circuit Current
(2)
........................ 100mA
*COMMENT
Stresses above those listed under
“
Absolute Maximum
Ratings
”
may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
Note:
(1) The minimum DC input voltage is
–
0.5V. During transitions, inputs may undershoot to
–
2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
+0.5V, which may overshoot to V
+ 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) These parameter are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from
–
1V to V
+1V.
(5) Maximum standby current (I
SB
) = 10
μ
A for the Automotive and Extended Automotive temperature range.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
I
CC1
Power Supply Current - Read
f
SCL
= 100kHz
V
CC
= 5V
f
SCL
= 400kHz
V
CC
= 5V
V
IN
= GND or V
CC
V
CC
= 5V
V
IN
= GND to V
CC
V
OUT
= GND to V
CC
400
μ
A
I
CC2
Power Supply Current - Write
4
mA
I
SB(5)
Standby Current
1
μ
A
I
LI
I
LO
V
IL
V
IH
V
OL1
V
OL2
Input Leakage Current
1
μ
A
μ
A
Output Leakage Current
1
Input Low Voltage
-0.5
V
CC
x 0.3
V
CC
+ 0.5
0.4
V
Input High Voltage
V
CC
x 0.7
V
Output Low Voltage (V
CC
= +3.0 V)
Output Low Voltage (V
CC
= +1.8 V)
I
OL
= 3.0 mA
I
OL
= 1.5 mA
V
0.5
V
RELIABILITY CHARACTERISTICS
Symbol
Parameter
N
END(3)
Endurance
T
DR(3)
Data Retention
I
LTH(3)(4)
Reference Test Method
Min
Typ
Max
Units
MIL-STD-883, Test Method 1033
100,000
Cycles/Byte
MIL-STD-883, Test Method 1008
100
Years
Latch-up
JEDEC Standard 17
100
mA
CAPACITANCE
T
A
= 25
°
C, f = 1.0 MHz, V
CC
= 5V
Symbol
Test
Conditions
Min
Typ
Max
Units
8
pF
C
IN(3)
Input Capacitance (SCL, WP, A0, A1)
V
IN
= 0V
6
pF
DC OPERATING CHARACTERISTICS
V
CC
= 1.8 V to 5.5 V, unless otherwise specified.
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