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參數資料
| 型號： | CAT1162W-30TE13 |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 電源管理 |
| 英文描述： | 1-CHANNEL POWER SUPPLY SUPPORT CKT, PDSO8 |
| 封裝： | SOIC-8 |
| 文件頁數： | 5/12頁 |
| 文件大小： | 77K |
| 代理商： | CAT1162W-30TE13 |
2
CAT1161/2
Doc. No. 3002, Rev. D
D.C. OPERATING CHARACTERISTICS
VCC = +2.7V to +6.0V, unless otherwise specified.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
ICC
Power Supply Current
fSCL = 100 KHz
3
mA
ISB
Standby Current
VCC = 3.3V
40
A
VCC = 5
50
A
ILI
Input Leakage Current
VIN = GND or VCC
2
A
ILO
Output Leakage Current
VIN = GND or VCC
10
A
VIL
Input Low Voltage
-1
VCC x 0.3
V
VIH
Input High Voltage
VCC X 0.7
VCC + 0.5
V
VOL1
Output Low Voltage (SDA)
IOL = 3 mA, VCC = 3.0V
0.4
V
ABSOLUTE MAXIMUM RATINGS
Temperature Under Bias ................. –55
°C to +125°C
Storage Temperature ....................... –65
°C to +150°C
Voltage on any Pin with
Respect to Ground(1) ............ –2.0V to +VCC +2.0V
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (TA = 25
°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300
°C
Output Short Circuit Current(2) ........................ 100 mA
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Max
Units
NEND(3)
Endurance
MIL-STD-883, Test Method 1033
1,000,000
Cycles/Byte
TDR(3)
Data Retention
MIL-STD-883, Test Method 1008
100
Years
VZAP(3)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
Volts
ILTH(3)(4)
Latch-Up
JEDEC Standard 17
100
mA
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
PIN FUNCTIONS
Pin No. Pin Name
Function
1
DC
Do Not Connect
2
RESET
Active Low Reset I/O
3
WP
Write Protect
4
GND
Ground
5
SDA
Serial Data/Address
6
SCL
Clock Input
7
RESET
Active High Reset I/O
8VCC
Power Supply
Main Menu
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相關代理商/技術參數 |
參數描述 |
|---|---|
| CAT1162W-42 | 功能描述:監(jiān)控電路 16K I2C Mem w/Reset RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數: 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復位:Resettable 監(jiān)視器:No Watchdog 電池備用開關:No Backup 上電復位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| CAT1162W-42 | 制造商:ON Semiconductor 功能描述:IC SM SUPERVISORY CCT W/ 16K E2 |
| CAT1162W45 | 制造商:Catalyst Semiconductor 功能描述: |
| CAT1162W-45 | 功能描述:監(jiān)控電路 16K I2C Mem w/Reset RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數: 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復位:Resettable 監(jiān)視器:No Watchdog 電池備用開關:No Backup 上電復位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| CAT1162W-45TE13 | 制造商:Rochester Electronics LLC 功能描述: 制造商:Catalyst Semiconductor 功能描述: |
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