參數(shù)資料
    型號(hào): C1808P183K1X4C
    廠商: KEMET Corporation
    英文描述: CERAMIC CHIP CAPACITORS
    中文描述: 陶瓷芯片電容器
    文件頁數(shù): 2/30頁
    文件大小: 2058K
    代理商: C1808P183K1X4C
    KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300
    CERAMIC CHIP CAPACITORS
    5.
    Dissipation Factor:
    Measured under same conditions as
    capacitance. (See Table 3)
    Dissipation factor (DF) is a measure of the losses in
    a capacitor under AC application. It is the ratio of the
    equivalent series resistance to the capacitive reac-
    tance, and is usually expressed in percent. It is normal-
    ly measured simultaneously with capacitance, and
    under the same conditions. The vector diagram below
    illustrates the relationship between DF, ESR and
    impedance. The reciprocal of the dissipation factor is
    called the
    Q
    or quality factor. For convenience, the
    Q
    factor is often used for very low values of dissipa-
    tion factor especially when measured at high frequen-
    cies. DF is sometimes called the
    loss tangent
    or
    tan-
    gent
    , as shown in Figure 2.
    6.
    Impedance:
    Since the parallel resistance (IR) is normally very
    high, the total impedance of the capacitor can be
    approximated by:
    Figure 3
    The variation of a capacitor's impedance with fre-
    quency determines its effectiveness in many applica-
    tions. At high frequency more detailed models apply -
    see KEMET SPICE models for such instances.
    7.
    Insulation Resistance:
    Measured after 2 minutes electrification at 25°C and
    rated voltage: Limits per Table 3.
    Insulation Resistance is the measure of a capacitor
    to resist the flow of DC leakage current. It is sometimes
    referred to as
    leakage resistance
    . Insulation resis-
    tance (IR) is the DC resistance measured across the
    terminals of a capacitor, represented by the parallel
    resistance (IR) shown in Figure 1. For a given dielectric
    type, electrode area increases with capacitance, result-
    ing in a decrease in the insulation resistance.
    Consequently, insulation resistance limits are usually
    specified as the
    RC
    (IR x C) product, in terms of ohm-
    farads or megohm-micro-farads. The insulation resis-
    tance for a specific capacitance value is determined by
    dividing this product by the capacitance. However, as
    the nominal capacitance values become small, the
    insulation resistance calculated from the RC product
    reaches values which are impractical. Consequently, IR
    specifications usually include both a minimum RC prod-
    uct and a maximum limit based on the IR calculated
    Figure 1
    C = Capacitance
    IR
    ESR
    C
    ESL
    ESL = Equivalent Series Inductance
    IR = Insulation Resistance
    ESR = Equivalent Series Resistance
    ESR x 100
    Xc
    DF(%) =
    Xc
    2 π
    fC
    1
    =
    Figure 2
    δ
    Ζ
    O
    Xc
    ESR
    Z =
    ESR + (XL - XC)
    2
    Where :
    Z = Total Impedance
    ESR = Equivalent Series Resistance
    XC = Capacitive Reactance = 1/(2
    π
    fC)
    XL = Inductive Reactance = (2
    π
    f
    )
    (ESL)
    Table 3
    Specified Electrical Limits
    Parameter
    Temperature Characteristics
    X7R/X5R
    C0G
    Z5U
    Capacitance & Dissipation Factor: Measured at following
    conditions:
    C0G – 1kHz and 1 vrms if capacitance >1000 pF
    1MHz and 1 vrms if capacitance
    1000 pF
    X7R/X5R/Y5V – 1kHz and 1 vrms* if capacitance
    10
    μ
    F
    X7R/X5R/Y5V – 120Hz and 0.5 vrms if capacitance
    >
    10
    μ
    F
    Y5V
    Z5U – 1kHz and 0.5 vrms
    DF Limits:
    **X5R
    <25V
    <25V
    50 - 200 volts –
    25 volts –
    16 volts –
    6.3/10 volts –
    Dielectric Strength: At 2.5 times rated DC voltage
    Insulation Resistance (IR): At rated DC voltage, whichever
    of the two is smaller. To get IR limit, divide M
    F
    value by
    the capacitance and compare to G
    limit. Select the lower
    of the two limits.
    Temperature: Range,
    °
    C
    Capacitance Change (without DC voltage)
    0.10%
    0.10%
    --------
    --------
    2.5%
    3.5%
    3.5%
    5.0%
    2.5%
    5.0%
    **
    **
    Pass Subsequent IR Test
    1,000 M
    μ
    F
    or 100 G
    (100,000 M
    )
    1,000 M
    μ
    F
    or 100 G
    (100,000 M
    )
    100 M
    μ
    F
    or 10 G
    (10,000 M
    )
    -55 to +125
    0
    ±
    30 ppm/
    °
    C
    -55 to +125
    ±
    15%
    -55 to +85
    ±
    15%
    +10 to +85
    +22% -56%
    5.0%
    7.0%
    7.0%
    10.0%
    100 M
    μ
    F
    or 10 G (
    16 volt)
    50 M
    F
    or 10G (
    10v)
    (10,000 M
    )
    -30 to +85
    +22% -82%
    4.0%
    4.0%
    -------
    X7R:
    X5R:
    Cap
    <564
    564
    DF
    5.0%
    10.0%
    *Note: Some values measured at
    1
    2
    volt, see X7R Table for specific details on pages 7
    4
    and 7
    5
    .
    6
    8
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