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參數(shù)資料
| 型號： | BU-65179F3-112W |
| 廠商： | DATA DEVICE CORP |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 2 CHANNEL(S), 1M bps, MIL-STD-1553 CONTROLLER, CQFP72 |
| 封裝： | 1 INCH, CERAMIC, QFP-72 |
| 文件頁數(shù)： | 11/12頁 |
| 文件大小： | 141K |
| 代理商： | BU-65179F3-112W |
8
Data Device Corporation
www.ddc-web.com
BU-65178/65179*/61688*/61689*
F1 web-09/02-0
ORDERING INFORMATION
BU-61588F3-11XX
Supplemental Process Requirements:
S = Pre-Cap Source Inspection
L = Pull Test
Q = Pull Test and Pre-Cap Inspection
K = One Lot Date Code
W = One Lot Date Code and PreCap Source
Y = One Lot Date Code and 100% Pull Test
Z = One Lot Date Code, PreCap Source and 100% Pull Test
Blank = None of the Above
Test Criteria:
0 = Standard Testing
2 = MIL-STD-1760 Amplitude Compliant - Applies to +5 Volt Transceiver Option Only
Process Requirements:
0 = Standard DDC practices, no Burn-In (See table below.)
1 = MIL-PRF-38534 Compliant
2 = B*
3 = MIL-PRF-38534 Compliant with PIND Testing
4 = MIL-PRF-38534 Compliant with Solder Dip
5 = MIL-PRF-38534 Compliant with PIND Testing and Solder Dip
6 = B* with PIND Testing
7 = B* with Solder Dip
8 = B* with PIND Testing and Solder Dip
9 = Standard DDC Processing with Solder Dip, no Burn-In (See table below.)
Temperature Range/Data Requirements:
1 = -55°C to +125°C
2 = -40°C to +85°C
3 = 0°C to +70°C
4 = -55°C to +125°C with Variables Test Data
5 = -40°C to +85°C with Variables Test Data
8 = 0°C to +70°C with Variables Test Data
Voltage/Transceiver Option:
0 = No Transceivers
3 = +5 Volts, rise/fall times=100 to 300 ns (-1553B) (See Test Criteria - 1760 Compliant with option -XX2)
Package Type:
F = 72-Pin Quad Flat Pack
P = 81-Pin PGA
G = 72-Pin Gull Lead (Contact factory.)
Product Type:
65178 = RT Only, 16/12 MHz, 4K RAM
61588 = BC/RT/MT, 16/12 MHz, 4K RAM
65179 = RT/RT_BOOT, 10/12/16/20 MHz, 4K RAM
61688 = BC/RT/MT, 12/16 MHz, 64K RAM
61689 = BC/RT/MT, 10/20 MHz, 64K RAM
*Standard DDC Processing with burn-in and full temperature test, see table below.
—
1015, Table 1
BURN-IN
A
2001
CONSTANT ACCELERATION
C
1010
TEMPERATURE CYCLE
A and C
1014
SEAL
—
2009, 2010, 2017, and 2032
INSPECTION
CONDITION(S)
METHOD(S)
MIL-STD-883
TEST
STANDARD DDC PROCESSING
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