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Agere Systems Inc.
Data Sheet
October 2001
BTK1A and BTM1A
Dual Differential Transceivers
Handling Precautions
CAUTION:This device is susceptible to damage as a result of electrostatic discharge. Take proper
precautions during both handling and testing. Follow guidelines such as JEDEC Publication
No. 108-A (Dec. 1988).
When handling and mounting line driver products, proper precautions should be taken to avoid exposure to
electrostatic discharge (ESD). The user should adhere to the following basic rules for ESD control:
1. Assume that all electronic components are sensitive to ESD damage.
2. Never touch a sensitive component unless properly grounded.
3. Never transport, store, or handle sensitive components except in a static-safe environment.
ESD Failure Models
Agere employs two models for ESD events that can cause device damage or failure:
1. A human-body model (HBM) that is used by most of the industry for ESD-susceptibility testing and protection-
design evaluation. ESD voltage thresholds are dependent on the critical parameters used to define the model.
A standard HBM (resistance = 1500
, capacitance = 100 pF) is widely used and, therefore, can be used for
comparison purposes.
2. A charged-device model (CDM), which many believe is the better simulator of electronics manufacturing
exposure.
Table 8 and Table 9 illustrate the role these two models play in the overall prevention of ESD damage. HBM ESD
testing is intended to simulate an ESD event from a charged person. The CDM ESD testing simulates charging and
discharging events that occur in production equipment and processes, e.g., an integrated circuit sliding down a
shipping tube.
The HBM ESD threshold voltage presented here was obtained by using these circuit parameters.
Table 8. Typical ESD Thresholds for Data Transmission Transceivers
Table 9. ESD Damage Protection
Device
BTK1A
BTM1A
All other pins
HBM Threshold
>
800
CDM Threshold
>
1000
>
2000
>
1000
ESD Threat Controls
Personnel
Wrist straps
ESD shoes
Antistatic flooring
Human-body model (HBM)
Processes
Control
Static-dissipative materials
Air ionization
Model
Charged-device model (CDM)