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Lucent Technologies Inc.
Data Sheet
October 1998
BTK1A, BTL1A, and BTM1A
Dual Differential Transceivers
Handling Precautions
CAUTION
:
This device is susceptible to damage as a result of electrostatic discharge. Take proper
precautions during both handling and testing. Follow guidelines such as JEDEC Publication
No. 108-A (Dec. 1988).
When handling and mounting line driver products, proper precautions should be taken to avoid exposure to electro-
static discharge (ESD). The user should adhere to the following basic rules for ESD control:
1. Assume that all electronic components are sensitive to ESD damage.
2. Never touch a sensitive component unless properly grounded.
3. Never transport, store, or handle sensitive components except in a static-safe environment.
ESD Failure Models
Lucent employs two models for ESD events that can cause device damage or failure:
1. A human-body model (HBM) that is used by most of the industry for ESD-susceptibility testing and protection-
design evaluation. ESD voltage thresholds are dependent on the critical parameters used to define the model. A
standard HBM (resistance = 1500
, capacitance = 100 pF) is widely used and, therefore, can be used for com-
parison purposes.
2. A charged-device model (CDM), which many believe is the better simulator of electronics manufacturing expo-
sure.
Tables 7 and 8 illustrate the role these two models play in the overall prevention of ESD damage. HBM ESD testing
is intended to simulate an ESD event from a charged person. The CDM ESD testing simulates charging and dis-
charging events that occur in production equipment and processes, e.g., an integrated circuit sliding down a ship-
ping tube.
The HBM ESD threshold voltage presented here was obtained by using these circuit parameters.
Table 7. Typical ESD Thresholds for Data Transmission Transceivers
Table 8. ESD Damage Protection
Device
BTK1A
BTL1A
BTM1A
All other pins
HBM Threshold
>
800
CDM Threshold
>
1000
>
2000
>
1000
ESD Threat Controls
Personnel
Wrist straps
ESD shoes
Antistatic flooring
Human-body model (HBM)
Processes
Control
Static-dissipative materials
Air ionization
Model
Charged-device model (CDM)