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參數(shù)資料
| 型號(hào)： | ATF1504SE(L) |
| 英文描述： | ATF1502/04/08/16SE(L) Preliminary [Updated 9/02. 69 Pages] Second Generation Industry Compatible 5V Logic Doubling CPLDs 32-512 Macrocells. standard & low power w/ISP |
| 中文描述： | ATF1502/04/08/16SE（長(zhǎng)）初步[更新9月2日。 69頁(yè)]第二代工業(yè)倍增兼容5V邏輯宏單元CPLD的32-512。標(biāo)準(zhǔn) |
| 文件頁(yè)數(shù)： | 1/69頁(yè) |
| 文件大?。?/td> | 601K |
| 代理商： | ATF1504SE(L) |
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1
Features
2nd Generation EE PROM-based Complex Programmable Logic Devices
– V
CCIO
of 5.0V or 3.3V with 3.3V Operation being 5V Tolerant
– 32 - 256 Macrocells with Enhanced Features
– Pin-compatible with Industry Standard Devices
– Speeds to 5 ns Maximum Pin-to-pin Delay
– Registered Operation to 250 MHz
Enhanced Macrocells with Logic Doubling
Features
– Bury Either Register or COM while Using the Other for Output
– Dual Independent Feedback Allows Multiple Latch Functions per Macrocell
– 5 Product Terms per Macrocell, expandable to 40 per Macrocell with Cascade
Logic, Plus 15 more with Foldback Logic
– D/T/Latch Configurable Flip-flops plus Transparent Latches
– Global and/or per Macrocell Register Control Signals
– Global and/or per Macrocell Output Enable
– Programmable Output Slew Rate per Macrocell
– Programmable Output Open Collector Option per Macrocell
– Fast Registered Input from Product Term
Enhanced Connectivity
– Single Level Switch Matrix for Maximum Routing Options
– Up to 40 Inputs per Logic Block
Advanced Power Management Features
– ITD (Input Transition Detection) Available Individually on Global Clocks, Inputs and
I/O for μA Level Standby Current for “L” Versions
– Pin-controlled 1 mA Standby Mode
– Reduced-power Option per Macrocell
– Automatic Power Down of Unused Macrocells
– Programmable Pin-keeper Inputs and I/Os
Available in Commercial and Industrial Temperature Ranges
Available in All Popular Packages Including PLCC, PQFP and TQFP
EE PROM Technology
– 100% Tested
– Completely Reprogrammable
– 10,000 Program/Erase Cycles
– 20 Year Data Retention
– 2000V ESD Protection
– 200 mA Latch-up Immunity
JTAG Boundary-scan Testing Port per IEEE 1149.1-1990 and 1149.1a-1993
– Pull-up Option on JTAG Pins TMS and TDI
IEEE 1532 Compatibility for Fast In-System Programmability (ISP) via JTAG
PCI-compliant
Security Fuse Feature
ATF15xxSE
Family
Datasheet
ATF1502SE(L)
ATF1504SE(L)
ATF1508SE(L)
ATF1516SE(L)
Preliminary
Rev. 2401D–PLD–09/02
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| ATF1504SV-15AC100 | Electrically-Erasable Complex PLD |
| ATF1504SV-15AC44 | Electrically-Erasable Complex PLD |
| ATF1504SV-15AI100 | Electrically-Erasable Complex PLD |
| ATF1504SV-15AI44 | Electrically-Erasable Complex PLD |
| ATF1504SV-15JC44 | Electrically-Erasable Complex PLD |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| ATF1504SL | 制造商:ATMEL 制造商全稱:ATMEL Corporation 功能描述:Family Datasheet |
| ATF1504SV-15AC100 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Electrically-Erasable Complex PLD |
| ATF1504SV-15AC44 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Electrically-Erasable Complex PLD |
| ATF1504SV-15AI100 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Electrically-Erasable Complex PLD |
| ATF1504SV-15AI44 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Electrically-Erasable Complex PLD |
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