
AT49HF/F010
3
DATA POLLING: The AT49F010/HF010 features DATA
polling to indicate the end of a program cycle. During a pro-
gram cycle an attempted read of the last byte loaded will
result in the complement of the loaded data on I/O7. Once
the program cycle has been completed, true data is valid
on all outputs and the next cycle may begin. DATA polling
may begin at any time during the program cycle.
TOG G LE B I T : I n add ition to D A T A p o llin g the
AT49F010/HF010 provides another method for determining
the end of a program or erase cycle. During a program or
erase operation, successive attempts to read data from the
device will result in I/O6 toggling between one and zero.
Once the program cycle has completed, I/O6 will stop tog-
gling and valid data will be read. Examining the toggle bit
may begin at any time during a program cycle.
HARDWARE DATA PROTECTION: Hardware features
pr ot ect ag ainst ina d ver t e n t pr og r a ms t o the
AT49F010/HF010 in the following ways: (a) V
CC sense—if
V
CC is below 3.8V (typical), the program function is inhib-
ited; (b) Program inhibit—holding any one of OE low, CE
high or WE high inhibits program cycles; and (c) Noise fil-
ter—Pulses of less than 15 ns (typical) on the WE or CE
inputs will not initiate a program cycle.
Notes:
1. The 8K word boot sector has the address range 00000H to 01FFFH.
2. Either one of the Product ID exit commands can be used.
Command Definition (in Hex)
Command
Sequence
Bus
Cycles
1st Bus
Cycle
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
5th Bus
Cycle
6th Bus
Cycle
Addr
Data
Addr
Data
Addr
Data
Addr
Data
Addr
Data
Addr
Data
Read
1
Addr
D
OUT
Chip Erase
6
5555
AA
2AAA
55
5555
80
5555
AA
2AAA
55
5555
10
Byte
Program
4
5555
AA
2AAA
55
5555
A0
Addr
D
IN
Boot Block
Lockout(1)
6
5555
AA
2AAA
55
5555
80
5555
AA
2AAA
55
5555
40
Product ID
Entry
3
5555
AA
2AAA
55
5555
90
Product ID
Exit(2)
3
5555
AA
2AAA
55
5555
F0
Product ID
Exit(2)
1
XXXX
F0
Absolute Maximum Ratings*
Temperature Under Bias ................................ -55
°C to +125°C
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
Storage Temperature ..................................... -65
°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to V
CC + 0.6V
Voltage on OE
with Respect to Ground ...................................-0.6V to +13.5V