
September 2005
rev 0.5
Switching Characteristics for ASM5P2304B Commercial Temperature Devices
Parameter
Description
1/t
1
Output Frequency
Duty Cycle
5
= (t
2
/ t
1
) * 100
(-1, -2, -1H, -2H)
Duty Cycle
5
= (t
2
/ t
1
) * 100
(-1, -2,-1H, -2H)
Output Rise Time
5
(-1, -2)
Output Rise Time
5
(-1, -2)
Output Rise Time
5
(-1H, -2H)
Output Fall Time
5
(-1, -2)
Output Fall Time
5
(-1, -2)
Output Fall Time
5
(-1H, -2H)
Output-to-output skew on same bank
(-1, -2)
Output-to-output skew (-1H, -2H)
Output bank A -to- output bank B skew
(-1, -2H)
Output bank A to output bank b skew
(-2)
Delay, REF Rising Edge to FBK Rising
Edge
ASM5P2304B
3.3V Zero Delay Buffer
5 of 13
Notice: The information in this document is subject to change without notice.
Test Conditions
Min Typ Max Unit
4
30pF load, -1,-1H,-2, -2H devices
Measured at 1.4V, F
OUT
= 20MHz
30pF load
Measured at 1.4V, F
OUT
= <20MHz
15pF load
Measured between 0.8V and 2.0V
30pF load
Measured between 0.8V and 2.0V
15pF load
Measured between 0.8V and 2.0V
30pF load
Measured between 2.0V and 0.8V
30pF load
Measured between 2.0V and 0.8V
15pF load
Measured between 2.0V and 0.8V
30pF load
20
MHz
40.0 50.0
60.0
%
45.0 50.0
55.0
%
t
3
2.20
nS
t
3
1.50
nS
t
3
1.50
nS
t
4
2.20
nS
t
4
1.50
nS
t
4
1.25
nS
All outputs equally loaded
200
All outputs equally loaded
200
All outputs equally loaded
200
t
5
All outputs equally loaded
400
pS
t
6
Measured at V
DD
/2
0
±250
pS
t
7
Device-to-Device Skew
5
Measured at V
DD
/2 on the FBK pins of
the device
Measured between 0.8V and 2.0V using
Test Circuit #2
Measured at 20MHz, loaded outputs,
15pF load
Measured at 20MHz, loaded outputs,
30pF load
Measured at 20MHz, loaded outputs,
15pF load
Measured at 20MHz, loaded outputs,
30pF load
Measured at 20MHz, loaded outputs,
15pF load
Stable power supply, valid clock
presented on REF and FBK pins
0
500
pS
t
8
Output Slew Rate
5
1
V/nS
175
200
t
J
Cycle-to-cycle jitter
5
(-1, -1H, -2H)
100
pS
400
t
J
Cycle-to-cycle jitter
5
(-2)
375
pS
t
LOCK
PLL Lock Time
5
1.0
mS
Note:
5. Parameter is guaranteed by design and characterization. Not 100% tested in production
.