參數(shù)資料
型號(hào): APW7066QAC-TRL
廠商: ANPEC ELECTRONICS CORP
元件分類: 穩(wěn)壓器
英文描述: Dual Synchronous Buck PWM Controllers and One Linear Controller
中文描述: SWITCHING CONTROLLER, QCC32
封裝: 5 X 5 MM, LEAD FREE, QFN-32
文件頁(yè)數(shù): 26/33頁(yè)
文件大小: 338K
代理商: APW7066QAC-TRL
Copyright
ANPEC Electronics Corp.
Rev. A.7 - Mar., 2008
APW7066
32
Reflow Condition (IR/Convection or VPR Reflow)
Classification Reflow Profiles
Profile Feature
Sn-Pb Eutectic Assembly
Pb-Free Assembly
Average ramp-up rate
(TL to TP)
3
°C/second max.
3
°C/second max.
Preheat
- Temperature Min (Tsmin)
- Temperature Max (Tsmax)
- Time (min to max) (ts)
100
°C
150
°C
60-120 seconds
150
°C
200
°C
60-180 seconds
Time maintained above:
- Temperature (TL)
- Time (tL)
183
°C
60-150 seconds
217
°C
60-150 seconds
Peak/Classification Temperature (Tp)
See table 1
See table 2
Time within 5
°C of actual
Peak Temperature (tp)
10-30 seconds
20-40 seconds
Ramp-down Rate
6
°C/second max.
6
°C/second max.
Time 25
°C to Peak Temperature
6 minutes max.
8 minutes max.
Note: All temperatures refer to topside of the package. Measured on the body surface.
Test item
Method
Description
SOLDERABILITY
MIL-STD-883D-2003
245
°C, 5 sec
HOLT
MIL-STD-883D-1005.7
1000 Hrs Bias @125
°C
PCT
JESD-22-B, A102
168 Hrs, 100
%RH, 121°C
TST
MIL-STD-883D-1011.9
-65
°C~150°C, 200 Cycles
ESD
MIL-STD-883D-3015.7
VHBM > 2KV, VMM > 200V
Latch-Up
JESD 78
10ms, 1tr > 100mA
Reliability Test Program
t 25 C to Peak
tp
Ramp-up
t
L
Ramp-down
ts
Preheat
Tsmax
Tsmin
T
L
T
P
25
T
e
m
p
e
ra
tu
re
Time
Critical Zone
T
L to TP
°
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