參數(shù)資料
型號: AN78LXX
廠商: Panasonic Corporation
英文描述: AB 6C 2#8,4#16 SKT RECP
中文描述: 3針正輸出電壓調節(jié)器(100毫安型)
文件頁數(shù): 6/12頁
文件大小: 179K
代理商: AN78LXX
AN78Lxx/AN78LxxM Series
6
SFF00005CEB
I
Electrical Characteristics at T
a
=
25
°
C (continued)
AN78L12, AN78L12M (12V type)
AN78L15, AN78L15M (15V type)
V
O
V
O
12.5
12.6
V
V
12
T
j
=
25
°
C
V
I
=
14.5 to 27V, I
O
=
1 to 70mA
V
I
=
14.5 to 27V, T
j
=
25
°
C
V
I
=
15 to 27V, T
j
=
25
°
C
REG
IN
250
200
mV
mV
120
100
REG
L
mV
20
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
15 to 27V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
15 to 25V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
19V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L12) and T
j
=
0 to 100
°
C
(AN78L12M)
I
Bias
mA
mA
μ
V
80
V
no
RR
dB
1
0.1
100
50
3.5
40
11.5
11.4
V
1.7
mA
140
1
mV/
°
C
10
50
I
Bias(IN)
I
Bias(L)
V
DIF(min)
I
O(Short)
V
O
/T
a
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
V
O
V
O
15.6
15.75
V
V
15
V
I
=
17.5 to 30V, I
O
=
1 to 70mA
V
I
=
17.5 to 30V, T
j
=
25
°
C
V
I
=
18 to 30V, T
j
=
25
°
C
REG
IN
300
250
mV
mV
130
110
REG
L
mV
25
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
18 to 30V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
18 to 28V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
I
Bias
mA
mA
μ
V
90
V
no
RR
dB
1
0.1
150
75
3.5
38
14.4
14.25
V
1.7
mA
140
1.3
12
48
T
j
=
25
°
C
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
23V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L15) and T
j
=
0 to 100
°
C
(AN78L15M)
mV/
°
C
I
Bias(IN)
I
Bias(L)
V
DIF(min)
I
O(Short)
V
O
/T
a
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
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