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參數(shù)資料
| 型號(hào)： | AN7824 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | EVALUATION BOARD |
| 中文描述： | 評(píng)價(jià)委員會(huì) |
| 文件頁數(shù)： | 6/10頁 |
| 文件大?。?/td> | 507K |
| 代理商： | AN7824 |
AN78xx/AN78xxF Series
Voltage Regulators
6
I
Electrical Characteristics at T
a
=
25
°
C (continued)
AN7815, 7815F (15V type)
V
V
mV
mV
mV
mV
mA
mA
mA
μ
V
dB
V
m
mA
A
mV/
°
C
15.6
15
T
j
=
25
°
C
V
I
=
18 to 30V, I
O
=
5mA to 1A,
T
j
=
0 to 125
°
C, P
D
≤
*
V
I
=
17.5 to 30V, T
j
=
25
°
C
V
I
=
20 to 26V, T
j
=
25
°
C
300
150
11
12
I
O
=
5mA to 1.5A, T
j
=
25
°
C
I
O
=
250 to 750mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
17.5 to 30V, T
j
=
25
°
C
I
O
=
5mA to 1A, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
18.5 to 28.5V, f
=
120Hz
I
O
=
1A, T
j
=
25
°
C
f
=
1kHz
V
I
=
30V, T
j
=
25
°
C
T
j
=
25
°
C
I
O
=
5mA, T
j
=
0 to 125
°
C
4
3
90
0.5
15.75
300
150
8
1
54
14.4
14.25
2
19
700
2
4
1
Parameter
Symbol
Conditions
Min
Typ
Max
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output impedance
Output short-circuit current
Peak output current
Output voltage temperature coefficient
Unit
V
O
V
O
REG
IN
REG
L
I
Bias
I
Bias(IN)
I
Bias(L)
V
no
RR
V
DIF(min)
Z
O
I
O(Short)
I
O(Peak)
V
O
/T
a
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
=
23V, I
=
500mA, C
I
=
0.33
μ
F and C
O
=
0.1
μ
F.
* AN78xx series: 15W, AN78xxF series: 10.25W
AN7818, 7818F (18V type)
Parameter
Output voltage
V
O
V
V
O
V
REG
IN
mV
mV
REG
L
mV
mV
mA
I
Bias
mA
I
Bias(IN)
I
Bias(L)
V
no
RR
mA
μ
V
dB
V
V
DIF(min)
Z
O
I
O(Short)
I
O(Peak)
V
O
/T
a
m
mA
A
mV/
°
C
18.7
18
T
j
=
25
°
C
V
I
=
21 to 33V, I
O
=
5mA to 1A,
T
j
=
0 to 125
°
C, P
D
≤
*
V
I
=
21 to 33V, T
j
=
25
°
C
V
I
=
24 to 30V, T
j
=
25
°
C
360
180
14
4
12
I
O
=
5mA to 1.5A, T
j
=
25
°
C
I
O
=
250 to 750mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
21 to 33V, T
j
=
25
°
C
I
O
=
5mA to 1A, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
22 to 32V, I
O
=
100mA, f
=
120Hz
I
O
=
1A, T
j
=
25
°
C
f
=
1kHz
V
I
=
35V, T
j
=
25
°
C
T
j
=
25
°
C
I
O
=
5mA, T
j
=
0 to 125
°
C
4.1
110
1
0.5
18.9
360
180
8
53
17.3
17.1
2
16
700
2
4
1.1
Symbol
Conditions
Min
Typ
Max
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output impedance
Output short-circuit current
Peak output current
Output voltage temperature coefficient
Unit
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
=
27V, I
=
500mA, C
I
=
0.33
μ
F and C
O
=
0.1
μ
F.
* AN78xx series: 15W, AN78xxF series: 10.25W
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