
V
O
9.35
V
9
V
O
V
V
I
=11.5 to 24V, I
O
=5 to 350mA,
T
j
=0 to 125C, P
D
15W
V
I
=11.5 to 25V, T
j
=25C
V
I
=12 to 25V, T
j
=25C
REG
IN
100
50
180
90
6.0
mV
mV
mV
mV
mA
mA
mA
μ
V
7
2
REG
L
25
10
I
O
=5 to 500mA, T
j
=25C
I
O
=5 to 200mA, T
j
=25C
T
j
=25C
4.1
I
bias
V
I
=12 to 25V, T
j
=25C
I
O
=5 to 350mA, T
j
=25C
f=10Hz to 100kHz
60
V
no
RR
dB
V
mA
0.8
0.5
9.45
56
8.65
8.55
V
I
=12 to 22V, I
O
=100mA, f=120Hz
I
O
=500mA, T
j
=25C
V
I
=35V, T
j
=25C
T
j
=25C
I
O
=5mA, T
j
=0 to 125C
T
j
=25C, I
I (Reset)
=1mA
2
300
0.7
– 0.5
A
V
1
1
mA
Output voltage
Output voltage tolerance
Line regulation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Output voltage at reset
Reset input current
Load regulation
Bias current
Input bias current fluctuation
Parameter
Symbol
Condition
min
typ
max
Unit
T
j
=25C
T
j
=25C
I
O (Peak)
V
O
/Ta
mV/C
V
O (Reset)
I
I (Reset)
·
AN78M09R (500mA, 9V Type)
Note 1) The specified condition T
=25C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=15V, I
O
=350mA, C
I
=0.33
μ
F, C
O
=0.1
μ
F, T
j
=0 to 125C
I
Electrical Characteristics (Ta=25C)
I
bias (IN)
I
bias (L)
V
DIF (min.)
I
O (Short)
<
V
O
12.5
V
12
V
O
V
V
I
=14.5 to 27V, I
O
=5 to 350mA,
T
j
=0 to 125C, P
D
15W
V
I
=14.5 to 30V, T
j
=25C
V
I
=16 to 30V, T
j
=25C
REG
IN
100
50
240
120
mV
mV
mV
mV
mA
mA
mA
μ
V
dB
8
2
REG
L
25
10
I
O
=5 to 500mA, T
j
=25C
I
O
=5 to 200mA, T
j
=25C
T
j
=25C
V
I
=14.5 to 30V, T
j
=25C
I
O
=5 to 350mA, T
j
=25C
f=10Hz to 100kHz
4.3
I
bias
75
V
no
RR
0.8
0.5
12.6
6
55
11.5
11.4
V
I
=15 to 25V, I
O
=100mA, f=120Hz
I
O
=500mA, T
j
=25C
V
I
=35V, T
j
=25C
T
j
=25C, V
I
=35V
I
O
=5mA, T
j
=0 to 125C
T
j
=25C, I
I (Reset)
=1mA
V
2
mA
mA
300
700
– 0.5
V
1
1
mA
T
j
=25C
Output voltage
Output voltage tolerance
Line regulation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage remperature coefficient
Output voltage at reset
Reset input current
Load regulation
Bias current
Input bias current fluctuation
Parameter
Symbol
Condition
min
typ
max
Unit
T
j
=25C
I
O (Peak)
V
O
/Ta
mV/C
V
O (Reset)
I
I (Reset)
·
AN78M12R (500mA, 12V Type)
Note 1) The specified condition T
j
=25C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=19V, I
O
=350mA, C
I
=0.33
μ
F, C
O
=0.1
μ
F, T
j
=0 to 125C
I
bias (IN)
I
bias (L)
V
DIF (min.)
I
O (Short)
<