
V
O
9.35
V
9
T
j
=25C
V
I
=12 to 24V, I
O
=5mA to 1A,
T
j
=0 to 125C, P
D
15W
V
I
=11.5 to 26V, T
j
=25C
V
I
=12 to 18V, T
j
=25C
V
O
V
REG
IN
180
90
180
90
mV
mV
mV
mV
mA
mA
mA
μ
V
7
2
REG
L
12
I
O
=5mA to 1.5A, T
j
=25C
I
O
=250 to 750mA, T
j
=25C
T
j
=25C
V
I
=11.5 to 26V, T
j
=25C
I
O
=5mA to 1A, T
j
=25C
f=10Hz to 100kHz
3.9
I
bias
57
V
no
RR
dB
V
m
1
0.5
9.45
8
56
8.65
8.55
V
I
=12 to 22V, I
O
=100mA, f=120Hz
I
O
=1A, T
j
=25C
f=1kHz
V
I
=26V, T
j
=25C
T
j
=25C
I
O
=5mA, T
j
=0 to 125C
T
j
=25C, I
I (Reset)
=1mA
2
16
Z
O
mA
700
A
2
4
– 0.5
V
1
1
mA
T
j
=25C
Output voltage
Output voltage tolerance
Line regulation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output impedance
Output short circuit current
Peak output current
Output voltage temperature coefficient
Output voltage at reset
Reset input current
Load regulation
Bias current
Input bias current fluctuation
Parameter
Symbol
Condition
min
typ
max
Unit
I
O (Peak)
V
O
/Ta
mV/C
V
O (Reset)
I
I (Reset)
·
AN7809R (1A, 9V Type)
Note 1) The specified condition T
=25C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=15V, I
O
=100mA, C
I
=0.33
μ
F, C
O
=0.1
μ
F, T
j
=0 to 125C
I
Electrical Characteristics (Ta=25C)
I
bias (IN)
I
bias (L)
V
DIF (min.)
I
O (Short)
<
V
O
12.5
V
12
T
j
=25C
V
I
=15 to 27V, I
O
=5mA to 1A,
T
j
=0 to 125C, P
D
15W
V
I
=14.5 to 30V, T
j
=25C
V
I
=16 to 22V, T
j
=25C
V
O
V
REG
IN
240
120
240
120
mV
mV
mV
mV
mA
mA
mA
μ
V
10
3
REG
L
12
I
O
=5mA to 1.5A, T
j
=25C
I
O
=250 to 750mA, T
j
=25C
T
j
=25C
V
I
=14.5 to 30V, T
j
=25C
I
O
=5mA to 1A, T
j
=25C
f=10Hz to 100kHz
4
I
bias
75
V
no
RR
dB
V
m
1
0.5
12.6
8
55
11.5
11.4
V
I
=15 to 25V, I
O
=100mA, f=120Hz
I
O
=1A, T
j
=25C
f=1kHz
V
I
=35V, T
j
=25C
T
j
=25C
I
O
=5mA, T
j
=0 to 125C
T
j
=25C, I
I (Reset)
=1mA
T
j
=25C
2
18
Z
O
mA
700
A
2
4
– 0.8
V
1
1
mA
Output voltage
Output voltage tolerance
Line regulation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output impedance
Output short circuit current
Peak output current
Output voltage temperature coefficient
Output voltage at reset
Reset input current
Load regulation
Bias current
Input bias current fluctuation
Parameter
Symbol
Condition
min
typ
max
Unit
I
O (Peak)
V
O
/Ta
mV/C
V
O (Reset)
I
I (Reset)
·
AN7812R (1A, 12V Type)
Note 1) The specified condition T
j
=25C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=19V, I
O
=100mA, C
I
=0.33
μ
F, C
O
=0.1
μ
F, T
j
=0 to 125C
I
bias (IN)
I
bias (L)
V
DIF (min.)
I
O (Short)
<