WAFER TEST LIMITS (@ V S =
參數(shù)資料
型號(hào)： AMP01GSZ
廠商： Analog Devices Inc
文件頁(yè)數(shù)： 19/22頁(yè)
文件大?。?/td> 0K
描述： IC AMP INST PREC LN 120MA 20SOIC
標(biāo)準(zhǔn)包裝： 37
放大器類型： 儀表
電路數(shù)： 1
轉(zhuǎn)換速率： 4.5 V/µs
-3db帶寬： 570kHz
電流 - 輸入偏壓： 2nA
電壓 - 輸入偏移： 40µV
電流 - 電源： 3mA
電流 - 輸出 / 通道： 120mA
電壓 - 電源，單路/雙路(±)： ±4.5 V ~ 18 V
工作溫度： 0°C ~ 70°C
安裝類型： 表面貼裝
封裝/外殼： 20-SOIC（0.295"，7.50mm 寬）
供應(yīng)商設(shè)備封裝： 20-SOIC W
包裝： 管件
AMP01
–6–
REV. D
WAFER TEST LIMITS (@ V
S =
15 V, RS = 10 k , RL = 2 k , TA = +25 C, unless otherwise noted)
AMP01NBC
AMP01GBC
Parameter
Symbol Conditions
Limit
Units
Input Offset Voltage
VIOS
60
120
V max
Output Offset Voltage
VOOS
4
8
mV max
Offset Referred to Input
PSR
V+ = +5 V to +15 V
dB min
vs. Positive Supply
G = 1000
120
110
dB min
G = 100
110
100
dB min
G = 10
95
90
dB min
G = 1
75
70
dB min
Offset Referred to Input
PSR
V– = –5 V to –15 V
dB min
vs. Negative Supply
G = 1000
105
dB min
G = 100
90
dB min
G = 10
70
dB min
G = 1
50
dB min
Input Bias Current
IB
48
nA max
Input Offset Current
IOS
13
nA max
Input Voltage Range
IVR
Guaranteed by CMR Tests
±10
V min
Common Mode Rejection
CMR
VCM =
±10 V
dB min
G = 1000
125
115
dB min
G = 100
120
110
dB min
G = 10
100
95
dB min
G = 1
85
75
dB min
Gain Equation Accuracy
G =
20
× R
S
R
G
0.6
0.8
% max
Output Voltage Swing
VOUT
RL = 2 k± 13
±13
V min
VOUT
RL = 500
±13
V min
VOUT
RL = 50
±2.5
V min
Output Current Limit
Output to Ground Short
±60
mA min
Output Current Limit
Output to Ground Short
±120
mA max
Quiescent Current
IQ
+V Linked to +VOP
4.8
mA max
–V Linked to –VOP
4.8
mA max
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
VIOS
NULL
RGAIN
RSCALE
VOOS
NULL
R1
47.5k
R2
2.5k
R4
2.5k
R3
47.5k
A1
A3
A2
Q1
Q2
250
–IN
+IN
REFERENCE
V+
+VOP
OUTPUT
–VOP
SENSE
V–
Figure 1. Simplified Schematic
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AMP01 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
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