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參數(shù)資料
| 型號(hào)： | AMP01 |
| 廠商： | Analog Devices, Inc. |
| 元件分類： | 運(yùn)動(dòng)控制電子 |
| 英文描述： | Low Noise, Precision Instrumentation Amplifier(低噪聲,精密的測(cè)量放大器) |
| 中文描述： | 低噪聲，精密儀表放大器（低噪聲，精密的測(cè)量放大器） |
| 文件頁數(shù)： | 7/22頁 |
| 文件大小： | 331K |
| 代理商： | AMP01 |
AMP01
–7–
REV. C
ELECTRICAL CHARACTERISTICS
(@ V
S
=
6
15 V, R
S
= 10 k
V
, R
L
= 2 k
V
, T
A
= +25
8
C, unless otherwise noted)
AMP01NBC
Typical
AMP01GBC
Typical
Parameter
Symbol
Conditions
Units
μ
V/
°
C
μ
V/
°
C
pA/
°
C
pA/
°
C
%
Input Offset Voltage Drift
Output Offset Voltage Drift
Input Bias Current Drift
Input Offset Current Drift
Nonlinearity
Voltage Noise Density
TCV
IOS
TCV
OOS
TCI
B
TCI
OS
0.15
20
40
3
0.0007
0.30
50
50
5
0.0007
R
G
=
∞
G = 1000
G = 1000
f
O
= 1 kHz
G = 1000
f
O
= 1 kHz
G = 1000
0.1 Hz to 10 Hz
G = 1000
0.1 Hz to 10 Hz
G = 1000
G = 10
To 0.01%, 20 V Step
G = 1000
e
n
5
5
nV/
√
Hz
Current Noise Density
i
n
0.15
0.15
pA/
√
Hz
Voltage Noise
e
n
p-p
0.12
2
0.12
2
μ
V p-p
pA p-p
Current Noise
i
n
p-p
Small-Signal Bandwidth (–3 dB) BW
Slew Rate
Settling Time
26
4.5
26
4.5
kHz
V/
μ
s
SR
t
S
50
50
μ
s
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
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