參數(shù)資料
型號: AM486
英文描述: Am486 Microprocessor Software User's Manual? 4.40MB (PDF)
中文描述: Am486微處理器軟件用戶手冊? 4.40MB(PDF格式)
文件頁數(shù): 16/52頁
文件大?。?/td> 1242K
代理商: AM486
16
Am486DE2 Microprocessor
SMIACT (New)
SMM Interrupt Active (Active-Low Output)
SMIACT goes Low in response to SMI. It indicates that
the processor is operating under SMM control. SMIACT
remains Low until the processor receives a RESET sig-
nal or executes the Resume instruction (RSM) to leave
SMM. This signal is always driven. It does not float dur-
ing bus HOLD or BOFF.
Note:
Do not use SRESET to exit from SMM. The sys-
tem should block SRESET during SMM.
SRESET (New)
Soft Reset (Input)
The CPU samples SRESET on every rising clock edge.
If SRESET is sampled active, the SRESET sequence
begins on the next instruction boundary. SRESET
resets the processor, but, unlike RESET, does not
cause it to sample UP or WB/WT, or affect the FPU,
cache, CD and NW bits in CR0, and SMBASE. SRESET
is asynchronous and must meet the same timing as
RESET.
STPCLK (New)
Stop Clock (Active-Low Input)
A Low input signal indicates a request has been made
to turn off the CLK input. When the CPU recognizes a
STPCLK, the processor:
I
stops execution on the next instruction boundary
(unless superseded by a higher priority interrupt)
I
empties all internal pipelines and write buffers
I
generates a Stop Grant acknowledge bus cycle
STPCLK is active Low and has an internal pull-up resis-
tor. STPCLK is asynchronous, but it must meet setup
and hold times t
20
and t
21
to ensure recognition in any
specific clock. STPCLK must remain active until the
Stop Clock special bus cycle is issued and the system
returns either RDY or BRDY.
TCK
Test Clock (Input)
Test Clock provides the clocking function for the JTAG
boundary scan feature. TCK clocks state information
and data into the component on the rising edge of TCK
on TMS and TDI, respectively. Data is clocked out of the
component on the falling edge of TCK on TDO.
TDI
Test Data Input (Input)
TDI is the serial input that shifts JTAG instructions and
data into the tested component. TDI is sampled on the
rising edge of TCK during the SHIFT-IR and the SHIFT-
DR TAP (Test Access Port) controller states. During all
other TAP controller states, TDI is ignored. TDI uses an
internal weak pull-up.
TDO
Test Data Output (Output)
TDO is the serial output that shifts JTAG instructions
and data out of the component. TDO is driven on the
falling edge of TCK during the SHIFT-IR and SHIFT-DR
TAP controller states. Otherwise, TDO is three-stated.
TMS
Test Mode Select (Input)
TMS is decoded by the JTAG TAP to select the opera-
tion of the test logic. TMS is sampled on the rising edge
of TCK. To guarantee deterministic behavior of the TAP
controller, the TMS pin has an internal pull-up resistor.
UP
Upgrade Present (Input)
The processor samples the Upgrade Present (UP) pin
in the clock before the falling edge of RESET. If it is Low,
the processor three-states its outputs immediately. UP
must remain asserted to keep the processor inactive.
The pin uses an internal pull-up resistor.
VOLDET (New, 168-Pin PGA Package only)
Voltage Detect (Output)
VOLDET provides an external signal to allow the system
to determine the CPU input power level (3 V or 5 V). For
the Am486DE2, the pin ties internally to V
SS
.
WB/WT (New)
Write-Back/Write-Through (Input)
WB/WT is sampled Low at RESET, and all cache-line
fills are write-through. WB/WT has an internal weak pull-
down. This pin should be tied Low for the Am486DE2
microprocessor.
W/R
Write/Read (Output)
A High output indicates a write cycle. A Low output in-
dicates a read cycle.
Note:
The Am486DE2 microprocessor does not use the
V
CC5
pin used by some 3-V, clock-tripled, 486-based
processors. The corresponding pin on the Am486DE2
microprocessor is an Internal No Connect (INC).
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