
22358B7
May 5, 2006
Am29LV160D
33
D A T A S H E E T
TEST CONDITIONS
Table 11. Test Specifications
Key to Switching Waveforms
2.7 k
Ω
C
L
6.2 k
Ω
3.3 V
Device
Under
Test
Figure 11. Test Setup
Note:
Diodes are IN3064 or equivalent
Test Condition
-70
-90, -120
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–3.0
V
Input timing measurement
reference levels
1.5
V
Output timing measurement
reference levels
1.5
V
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
3.0 V
0.0 V
1.5 V
1.5 V
Output
Measurement Level
Input
Figure 12. Input Waveforms and Measurement Levels