參數(shù)資料
型號: AM29F800BB-55EE
廠商: ADVANCED MICRO DEVICES INC
元件分類: PROM
英文描述: 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory
中文描述: 512K X 16 FLASH 5V PROM, 55 ns, PDSO48
封裝: MO-142DD, TSOP-48
文件頁數(shù): 43/44頁
文件大小: 702K
代理商: AM29F800BB-55EE
November 2, 2006 21504E5
Am29F800B
41
D AT A S H E E T
REVISION SUMMARY
Revision A (August 1997)
Initial release.
Revision B (October 1997)
Global
Added -55 speed option. Changed data sheet designa-
tion from Advance Information to Preliminary.
Sector Protection/Unprotection
Corrected text to indicate that these functions can only
be implemented using programming equipment.
Table 1, Device Bus Operations
Revised to indicate inputs for both CE# and RESET#
are required for standby mode.
Program Command Sequence
Changed to indicate Data# Polling is active for 2 μs
after a program command sequence if the sector spec-
ified is protected.
Sector Erase Command Sequence and DQ3: Sector
Erase Timer
Corrected sector erase timeout to 50 μs.
Erase Suspend Command
Changed to indicate that the device suspends the
erase operation a maximum of 20 μs after the rising
edge of WE#.
DC Characteristics
Changed to indicate V
ID
min and max values are 11.5
to 12.5 V, with a V
CC
test condition of 5.0 V. Added
typical values to TTL table. Revised CMOS typical
standby current (I
CC3
).
Figure 14: Chip/Sector Erase Operation Timings;
Figure 19: Alternate CE# Controlled Write
Operation TImings
Corrected hexadecimal values in address and data
waveforms. In Figure 19, corrected data values for chip
and sector erase.
Erase and Programming Performance
Corrected word and chip programming times.
Revision C (January 1998)
Global
Formatted for consistency with other 5.0 volt-only
data sheets.
Revision C+1 (April 1998)
Distinctive Characteristics
Changed typical program/erase current to 30 mA to
match the CMOS DC Characteristics table.
Changed minimum endurance to 1 million write cycles
per sector guaranteed.
AC Characteristics
Erase/Program Operations:
Corrected the notes refer-
ence for t
WHWH1
and t
WHWH2
. These parameters are
100% tested. Changed t
DS
and t
CP
specifications for 55
ns device. Changed t
WHWH1
word mode specification
to 12 μs.
Alternate CE# Controlled Erase/Program Operations:
Corrected the notes reference for t
WHWH1
and t
WHWH2
.
These parameters are 100% tested. Changed t
DS
and
t
CP
specifications for 55 ns device. Changed t
WHWH1
word mode specification to 12 μs.
Temporary Sector Unprotect Table
Added note reference for t
VIDR
. This parameter is not
100% tested.
Erase and Programming Performance
In Notes 1 and 6, changed the endurance specification
to 1 million cycles.
Revision C+2 (April 1998)
Product Selector Guide
Deleted the -55 speed option for V
CC
= 5.0 V ± 5%.
Added the -55 speed option for V
CC
= 5.0 V ± 10%.
Ordering Information
Valid Combinations for Am29F800BT-55 and
Am29F800BB-55:
Added the extended temperature
range for all package types.
Operating Ranges
V
CC
Supply Voltages:
Deleted “V
CC
for ± 5% devices .
. . . +4.75 V to +5.25 V”. Changed “V
CC
for ±10%
devices . . . . +4.5 V to +5.5 V” to “V
CC
for all devices .
. . . +4.5 V to +5.5 V”.
Erase and Programming Performance
Note 2:
Deleted “(4.75 V for -55)”.
相關PDF資料
PDF描述
AM29F800BB-55EF 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory
AM29F800BB-55EI 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory
AM29F800BB-55EK 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory
AM29F800BB-55SC 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory
AM29F800BB-55SD 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory
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